Hostname: page-component-8448b6f56d-tj2md Total loading time: 0 Render date: 2024-04-18T10:35:44.143Z Has data issue: false hasContentIssue false
  • English
  • Français

Aberration Corrected Zernike Phase Contrast TEM

Published online by Cambridge University Press:  23 November 2012

H. Iijima ,
S. Motoki ,
F. Hosokawa  and
Y. Ohkura
H. Iijima
Affiliation:
JEOL LTD., Tokyo, Japan
S. Motoki
Affiliation:
JEOL LTD., Tokyo, Japan
F. Hosokawa
Affiliation:
JEOL LTD., Tokyo, Japan
Y. Ohkura
Affiliation:
JEOL LTD., Tokyo, Japan
Get access

Abstract

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

Type
Research Article
Information
Microscopy and Microanalysis , Volume 18 , Issue S2: Proceedings of Microscopy & Microanalysis 2012 , July 2012 , pp. 492 - 493
Copyright
Copyright © Microscopy Society of America 2012

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)