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4D-STEM Imaging With the pnCCD (S)TEM-Camera

Published online by Cambridge University Press:  23 September 2015

M. Simson
Affiliation:
PNDetector GmbH, SckellstraBe 3, 81667 Munchen, Germany
H. Ryll
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
H. Banba
Affiliation:
JEOL Ltd.,3-1-2 Musashino Akishima Tokyo 196-8558, Japan
R. Hartmann
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
M. Huth
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
S. Ihle
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
L. Jones
Affiliation:
Department of Materials, University of Oxford, 13 Parks Road, Oxford OX13PH, UK
Y. Kondo
Affiliation:
JEOL Ltd.,3-1-2 Musashino Akishima Tokyo 196-8558, Japan
K. Muller
Affiliation:
Universitat Bremen, Otto-Hahn-Allee 1, 28359 Bremen, Germany
P.D. Nellist
Affiliation:
Department of Materials, University of Oxford, 13 Parks Road, Oxford OX13PH, UK
R. Sagawa
Affiliation:
JEOL Ltd.,3-1-2 Musashino Akishima Tokyo 196-8558, Japan
J. Schmidt
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
H. Soltau
Affiliation:
PNDetector GmbH, SckellstraBe 3, 81667 Munchen, Germany
L. Striider
Affiliation:
PNSensor GmbH, Otto-Hahn-Ring 6, 81739 Munchen, Germany
H. Yang
Affiliation:
Department of Materials, University of Oxford, 13 Parks Road, Oxford OX13PH, UK
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Abstract

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Copyright
Copyright © Microscopy Society of America 2015 

References

[1] Ryll, H., et al., Microscopy and Microanalysis 19 (2013). p. 11601161.CrossRefGoogle Scholar
[2] Rodenburg, J.M., McCallum, B.C. & Nellist, P.D., Ultramicroscopy. 48 (1993) 304314.CrossRefGoogle Scholar
[3] Yang, H., et al., Ultramicroscopy. doi:10.1016/j.ultramic.2014.10.013.Google Scholar
[4] Muller, K., et al., Appl. Phys. Lett. 101 (2012). p. 21211012121104.Google Scholar
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