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2015 NIST Workshop on Analytical Transmission Scanning Electron Microscopy

Published online by Cambridge University Press:  04 August 2017

Robert R. Keller
Robert R. Keller*
Affiliation:
National Institute of Standards and Technology, Applied Chemicals and Materials Division, Boulder, CO, USA

Abstract

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Abstract
Information
Microscopy and Microanalysis , Volume 23 , Supplement S1: Proceedings of Microscopy & Microanalysis 2017 , July 2017 , pp. 598 - 599
Copyright
© Microscopy Society of America 2017 

References

[1] Keller, R. R. & Geiss, R. H. J. Microscopy 245 2012 245–251.Google Scholar
[2] Trimby, P. W. Ultramicroscopy 120 2012 16–24.CrossRefGoogle Scholar
[3] Fundenberger, J. J., et al, Ultramicroscopy 161 2016 17–22.Google Scholar
[4] Holm, J. & Keller, R. R. Ultramicroscopy 167 2016 43–56.CrossRefGoogle Scholar
[5] Jacobson, B. T., et al, Proc. SPIE Vol. 9376 2015 93760K-1–93760K-13.Google Scholar
[6] This work is a contribution of the U.S. Department of Commerce and is not subject to copyright in the United States.Google Scholar