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Picosecond time-resolved X-ray diffraction from laser-shocked semiconductors



Ultrashort pulsed hard X rays are generated by focusing an intense femtosecond laser beam onto metal targets. Kα emissions are obtained from a Cu target. Picosecond time-resolved X-ray diffraction is performed to investigate structural dynamics of laser-shocked semiconductors using the laser plasma X-ray pulses. Lattice deformation associated with shock-wave propagation is directly observed. Evolution of strain profiles inside the crystal is determined without disturbance from the time-resolved X-ray diffraction patterns.


Corresponding author

Address correspondence and reprint requests to: Kazutaka G. Nakamura, Materials and Structures Laboratory, Tokyo Institute of Technology, 4259 Nagatsuta, Yokohama 226-8503, Japan. E-mail:


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