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Incident ion charge state dependence of the visible light emission of Xeq+ ions bombarding aluminum

Published online by Cambridge University Press:  17 October 2016

Y. Guo
Affiliation:
Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou, 730000, People's Republic of China Institute of Modern Physics, University of Chinese Academy of Sciences, Beijing, 100049, People's Republic of China
Z. Yang*
Affiliation:
Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou, 730000, People's Republic of China
Q. Xu
Affiliation:
Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou, 730000, People's Republic of China Institute of Modern Physics, University of Chinese Academy of Sciences, Beijing, 100049, People's Republic of China
J. Ren
Affiliation:
Department of Applied Physics, Xi'an Jiaotong University, Xi'an, 710049, People's Republic of China
H. Zhao
Affiliation:
Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou, 730000, People's Republic of China
Y. Zhao
Affiliation:
Department of Applied Physics, Xi'an Jiaotong University, Xi'an, 710049, People's Republic of China
*
Address correspondence and reprint requests to: Z. Yang, Institute of Modern Physics, Chinese Academy of Sciences, Lanzhou, 730000, People's Republic of China. E-mail: z.yang@impcas.ac.cn

Abstract

In this work, we studied the photon emission in the visible light range for Xeq+ ions of different charge states (10 ≤ q ≤ 21) bombardment on an aluminum target at 410 keV. During the interactions, the spectra in wavelength range 300–500 nm are recorded, including the photons from Al atoms and neutralized Xe+ ions. The yield of the visible light strongly depends on the projectile charge states. Its variation tendency with the charge states is similar to that of the potential energy variation. In addition, the experimental results also indicate that when the incident charge state is less than the critical charge state, it obeys the staircase classical-over-barrier model.

Type
Research Article
Copyright
Copyright © Cambridge University Press 2016 

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