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Measurement of XUV sources' wavefronts

Published online by Cambridge University Press:  30 July 2001

S. LE PAPE
Affiliation:
Laboratoire de Spectroscopie Atomique et Ionique, Bât 350, Université Paris-sud, 91405 Orsay, France
PH. ZEITOUN
Affiliation:
Laboratoire de Spectroscopie Atomique et Ionique, Bât 350, Université Paris-sud, 91405 Orsay, France
P. DHEZ
Affiliation:
Laboratoire de Spectroscopie Atomique et Ionique, Bât 350, Université Paris-sud, 91405 Orsay, France
M. FRANÇOIS
Affiliation:
Institut d'Electronique et de Microélectronique du Nord, Université des Sciences et Technologie de Lille, avenue Poincaré BP 69, 59652 Villeneuve d'Ascq, France
M. IDIR
Affiliation:
Laboratoire de Spectroscopie Atomique et Ionique, Bât 350, Université Paris-sud, 91405 Orsay, France
D. ROS
Affiliation:
Laboratoire de Spectroscopie Atomique et Ionique, Bât 350, Université Paris-sud, 91405 Orsay, France
A. CARILLON
Affiliation:
Laboratoire de Spectroscopie Atomique et Ionique, Bât 350, Université Paris-sud, 91405 Orsay, France

Abstract

New fields of X-ray source applications (X-ray laser and high order harmonic generation) could appear if an intensity higher than 1012 Wcm−2 is reached. Following this goal, we have started a complete investigation of the X-ray beam wavefront both numerically and experimentally. The first XUV wavefront sensor has been developed and tested on different XUV sources. For a better comprehension of the experimental results, a numerical work (ray-trace code) has been performed. We present and discuss the first results obtained on the X-ray laser at 21.2 nm.

Type
Research Article
Copyright
© 2001 Cambridge University Press

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