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Textures of laser ablated superconducting thin films of YBa2Cu3O7−δ as a function of deposition temperature

Published online by Cambridge University Press:  31 January 2011

F. Heidelbach
Affiliation:
Department of Geology and Geophysics, University of California, Berkeley, California 94720, and Center for Materials Science, Los Alamos National Laboratory, Los Alamos, New Mexico 87545
H-R. Wenk
Affiliation:
Department of Geology and Geophysics, University of California, Berkeley, California 94720, and Center for Materials Science, Los Alamos National Laboratory, Los Alamos, New Mexico 87545
R.E. Muenchausen
Affiliation:
Exploratory Research & Development Center, Los Alamos National Laboratory, Los Alamos, New Mexico 87545
S. Foltyn
Affiliation:
Exploratory Research & Development Center, Los Alamos National Laboratory, Los Alamos, New Mexico 87545
N. Nogar
Affiliation:
Exploratory Research & Development Center, Los Alamos National Laboratory, Los Alamos, New Mexico 87545
A.D. Rollett
Affiliation:
Materials Science & Technology Division, Los Alamos National Laboratory, Los Alamos, New Mexico 87545
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Abstract

The preferred orientation of a series of laser deposited superconducting thin films of YBa2Cu3O7−δ on LaAlO3 substrate has been examined. X-ray measurements (pole figures, χ-scans, ω-scans, rocking curves) reveal an increasingly strong preferred orientation of the polycrystalline material with c-axes perpendicular to the substrate surface as deposition temperature increases. At low temperatures c-axes are predominantly parallel to the substrate surface. Characteristic parameters of the texture types were derived from those measurements. With higher temperatures twinning on (110) was observed. The different texture types are interpreted in terms of a layered film structure.

Type
Articles
Copyright
Copyright © Materials Research Society 1992

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References

1Geerk, J., Linker, G., and Meyer, O., Mater. Sci. Rep. 4, 193260 (1989).CrossRefGoogle Scholar
2Simon, R.W., Platt, C.E., Lee, A.E., Lee, G. S., Daly, K.P., Wire, M.S., Luine, J.A., and Urbanik, M., Appl. Phys. Lett. 53, 26772679 (1988).Google Scholar
3Siegal, M.P., Phillips, J.M., van Dover, R.B., Tiefel, T.H., and Marshall, J. H., J. Appl. Phys. 68, 63536360 (1990).Google Scholar
4Carim, A. H., Basu, S.N., and Muenchausen, R.E., Appl. Phys. Lett. 58, 871873 (1991).CrossRefGoogle Scholar
5Basu, S.N., Roy, T., Mitchell, T.E., Muenchausen, R.E., and Nastasi, M. A., Proc. Conf. Science and Technology of Thin Film Superconductors, edited by McConnell, R. and Noufi, R., Denver, CO, 1990 (1991, in press).Google Scholar
6Muenchausen, R.E., Foltyn, S.R., Wu, X.D., Dye, R.C., Nogar, N.S., Carim, A.H., Heidelbach, F., Cooke, D.W., Taber, R.C., and Quinn, R. K., SPIE Proc. Ser., Santa Clara, CA, 1990, 1394, 221–229 (1990).Google Scholar
7Francois, M., Junod, A, Yvon, K., Hewat, A. W., Capponi, J.J., Strobel, P., Marezio, M., and Fischer, P., Solid State Commun. 66, 11171125 (1988).Google Scholar
8Geller, S. and Bala, V.B., Acta Cryst. 9, 10191025 (1956).Google Scholar
9Dimos, D., Chaudhari, P., Tsuei, C. C., and McGuire, T. R., Phys. Rev. Lett. 61, 2476 (1988).Google Scholar
10Dinger, T.R., Worthington, T.K., Gallagher, W.V., and Saddstrom, R.L., Phys. Rev. Lett. 58, 2687 (1987).Google Scholar
11Muenchausen, R.E., Hubbard, K.M., Foltyn, S., Estler, R.C., Nogar, N.C., and Jenkins, C., Appl. Phys. Lett. 56 (6), 578580 (1990).CrossRefGoogle Scholar
12Estler, R. C., Nogar, N. S., Muenchausen, R. E., Wu, X. D., Foltyn, S., and Garcia, A. R., Rev. Sci. Instrum. 62, 437 (1991).Google Scholar
13Intrater, J. and Weissmann, S., Acta Cryst. 7, 729733 (1954).Google Scholar
14Rollett, A.D., Wenk, H-R., Heidelbach, F., Schofield, T.G., Muenchausen, R.E., Raistrick, I. D., Arendt, P. N., Korzekawa, D.A., Bennett, K., and Kallend, J.S., Proc. 9th Int. Conf. Tex. Mat., Avignon, France, 1990 (1991, in press).Google Scholar
15Roy, T. and Mitchell, T., Philos. Mag. 63, 225–232 (1991).CrossRefGoogle Scholar
16Amelinckx, S., Tendeloo, G., and van Landuyt, J., edited by Moran-Lopez, J. L. and Schuller, I. K., in Oxygen Disorder Effects in High Tc Superconductors (Plenum Press, New York), pp. 9–46Google Scholar