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Surface, interface, and thin-film magnetism

Published online by Cambridge University Press:  31 January 2011

L. M. Falicov
Affiliation:
Department of Physics, University of California-Berkeley, and Lawrence Berkeley Laboratory, Berkeley, California 94720
Daniel T. Pierce
Affiliation:
National Institute of Standards and Technology, Gaithersburg, Maryland 20899
S. D. Bader
Affiliation:
Materials Science Division, Argonne National Laboratory, Argonne, Illinois 60439
R. Gronsky
Affiliation:
Department of Materials Science and Mineral Engineering, University of California-Berkeley, and Lawrence Berkeley Laboratory, Berkeley, California 94720
Kristl B. Hathaway
Affiliation:
Office of Naval Research, Arlington, Virginia 22217-5000
Herbert J. Hopster
Affiliation:
Department of Physics, University of California-Irvine, Irvine, California 92717
David N. Lambeth
Affiliation:
Department of Electrical and Computer Engineering, Carnegie Mellon University, Pittsburgh, Pennsylvania 15213-3890
S. S. P. Parkin
Affiliation:
I.B.M. Almaden Research Center, San Jose, California 95120-6099
Gary Prinz
Affiliation:
Naval Research Laboratory, Washington, DC 20375
Myron Salamon
Affiliation:
Department of Physics, University of Illinois, Urbana, Illinois 61801
Ivan K. Schuller
Affiliation:
Department of Physics, University of California-San Diego, La Jolla, California 92093
R. H. Victora
Affiliation:
Diversified Technologies Research Laboratories, Eastman Kodak Company, Rochester, New York 14650-2017
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Abstract

A comprehensive review and state of the art in the field of surface, interface, and thin-film magnetism is presented. New growth techniques which produce atomically engineered novel materials, special characterization techniques to measure magnetic properties of low-dimensional systems, and computational advances which allow large complex calculations have together stimulated the current activity in this field and opened new opportunities for research. The current status and issues in the area of material growth techniques and physical properties, characterization methods, and theoretical methods and ideas are reviewed. A fundamental understanding of surface, interface, and thin-film magnetism is of importance to many applications in magnetics technology, which is also surveyed. Questions of fundamental and technological interest that offer opportunities for exciting future research are identified.

Type
Materials Reports
Copyright
Copyright © Materials Research Society 1990

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References

REFERENCES

1Moruzzi, V. L., Janak, J. F., and Williams, A. R., Calculated Electronic Properties of Metals (Pergamon, New York, 1978).Google Scholar
2Jansen, H. J. F., Hathaway, K. B., and Freeman, A. J., Phys. Rev. B 30, 6117 (1984).Google Scholar
3Wolfarth, E. P., Ferromagnetic Materials edited by Wolfarth, E. P. (North Holland, Amsterdam, 1980), Vol. 1, p. 1.Google Scholar
4Norman, M. R. and Freeman, A. J., in The Challenge of d and f Electrons, edited by Salahub, D. R. and Zerner, M. C. (American Chemical Society, Washington, DC, 1989), p. 273.Google Scholar
5Fu, C. L., Freeman, A. J., and Oguchi, T., Phys. Rev. Lett. 54, 2700 (1985); R. Richter, J. G. Gay, and J. R. Smith, Phys. Rev. Lett. 54, 2704 (1985).Google Scholar
6 See, for example, Wang, D., Freeman, A. J., and Weinert, M., J. Magn. Magn. Mat. 31–34, 891 (1983).Google Scholar
7Hong, S. C, Freeman, A. J., and Fu, C. L., J. de Physique C8, 1683 (1988).Google Scholar
8Peng, S. S. and Jansen, H. J. F., J. Appl. Phys. 64, 5607 (1988).Google Scholar
9Wang, C. S., Klein, B. M., and Krakauer, H., Phys. Rev. Lett. 54, 1852 (1985).Google Scholar
10Hathaway, K. B., Jansen, H. J. F., and Freeman, A. J., Phys. Rev. B 31, 7603 (1985).Google Scholar
11Wang, C. S. and Callaway, J., Phys. Rev. B 15, 298 (1977).Google Scholar
12Jarlborg, T. and Peter, M., Magn, J.. Magn. Mat. 42, 89 (1984).Google Scholar
13A discussion of some discrepancies between theory and de Haas-van Alphen data for Co may be found in Himpsel, F. J. and Eastman, D. E., Phys. Rev. B 21, 3207 (1980).Google Scholar
14 See, for example, Victora, R. H., in Magnetic Properties of Low-Dimensional Systems, edited by Falicov, L.M. and Morán-Lépez, J. L. (Springer-Verlag, Berlin-Heidelberg-New York-Tokyo, 1986), p. 25.Google Scholar
15Car, R. and Parinello, M., Phys. Rev. Lett. 55, 2471 (1985); ibid. 60, 204 (1988).Google Scholar
16Brooks, H., Phys. Rev. 58, 909 (1940).Google Scholar
17Hutchings, M.T., in Solid State Physics, edited by Seitz, F. and Turnbull, D. (Academic Press, New York, 1964), Vol. 16, p. 227, and references therein.Google Scholar
18Néel, L., J. Phys. Rad. 15, 225 (1954).Google Scholar
19Mattis, D.C., The Theory of Magnetism (Harper and Row, New York, 1965), Chap. 9.Google Scholar
20Yang, C. N., Phys. Rev. 85, 809 (1952).Google Scholar
21Toda, M., Kubo, R., and Saito, N., Statistical Physics I (Equilibrium Statistical Mechanics) (Springer-Verlag, Berlin-Heidelberg-New York-Tokyo, 1983), p. 149.Google Scholar
22Stanley, H. E., Introduction to Phase Transitions and Critical Phenomena (Oxford University Press, Oxford, 1971).Google Scholar
23Kosterlitz, J. M. and Thouless, D. J., in Progress in Low Temperature Physics, edited by Brewer, D. F. (North Holland, Amsterdam, 1978), Vol. VII B.Google Scholar
24Fisher, M. E. and Ferdinand, A. E., Phys. Rev. Lett. 19 169 (1967).Google Scholar
25Lipowsky, R., Phys. Rev. Lett. 49 1575 (1982); R. Lipowsky and W. Speth, Phys. Rev. B. 28 2983 (1983); R. Lipowsky, Z. Phys. B 55, 345 (1984); R. Lipowsky, Phys. Rev. Lett. 52 1429 (1984); R. Lipowsky, Phys. Rev. B 32, 1731 (1985); R. Lipowsky, Ferroelectrics 73, 69 (1987); R. Lipowsky, in Random Fluctuations and Pattern Growth, edited by H. E. Stanley and N. Ostrowsky (Kluwer Academic, Dordrecht, 1988).Google Scholar
26Dietrich, S., in Phase Transitions and Critical Phenomena edited by Domb, C. and Leibowitz, J. L. (Academic Press, London, 1988), Vol. 8, p. 1.Google Scholar
27 See, for instance, Ziman, J. M., Principle of the Theory of Solids (Cambridge, 1972), 2nd ed., pp. 250ff, 301ff; A. B. Pippard, Magnetoresistance in Metals (Cambridge University Press, Cambridge, 1989).Google Scholar
28Taylor, G. R., Isin, A., and Coleman, R.V., Phys. Rev. 165 621 (1968); Coleman, R.V., Morris, R.C., and Sellmyer, D.J., Phys. Rev. B 8, 317 (1973); R.W. Klaffky and R.V. Coleman, Phys. Rev. B 10, 4803 (1974).Google Scholar
29Cabrera, G. G. and Falicov, L. M., Phys. Status Solidi B 61 539 (1974); ibid., 62 217 (1974); Cabrera, G. G. and Falicov, L. M., Phys. Rev. B 11 2651 (1975).Google Scholar
30Brown, W. F., Micromagnetics (Wiley, New York, 1963).Google Scholar
31Friedberg, R. and Paul, D.I., Phys. Rev. Lett. 34, 1234 (1975).Google Scholar
32Victora, R. H., Phys. Rev. Lett. 58 1788 (1987).Google Scholar
33Smith, N., J. Appl. Phys. 63, 2932 (1988); Scheinfein, M.R., Unguris, J., Celotta, R. J., and Pierce, D.T., Phys. Rev. Lett. 63 668 (1989).Google Scholar
34 See, for instance, Meyer, K.E., Schuller, I.K., and Falco, C.M., J. Appl. Phys. 52, 5803 (1981).Google Scholar
35Venkatesan, T., Wu, X.D., Dutta, B.D., Inam, A., Hedge, M.S., Hwang, D. M., Chang, C. C., Nazar, L., and Wilkens, B., in Science and Technology of Thin Film Superconductors, edited by McConnell, R. D. and Wolf, S. A. (Plenum, New York, 1988), p. 1.Google Scholar
36Kaplan, R., J. Vac. Sci. Tech. A1 551 (1983).Google Scholar
37Ceck, R.E. and Alessandrini, E.I., Trans. Am. Soc. Met. 51 50 (1959).Google Scholar
38 See, for instance, Epitaxial Growth, edited by Matthews, J.W. (Academic Press, New York, 1975).Google Scholar
39Erwin, R.W., Rhyne, J. J., Salamon, M. B., Borchers, J., Sinha, S., Du, R., Cunningham, J. E., and Flynn, C. P., Phys. Rev. B 35, 6808 (1987).Google Scholar
40 For an extensive compilation of epitaxial systems see, for instance, E. Grünbaum, Ref. 38, p. 611.Google Scholar
41 See, for instance, Staudhammer, K. P. and Meur, O. E., Atlas of Binary Alloys (Marcel Dekker, New York, 1973).Google Scholar
42 See various articles in Physics, Fabrication and Applications of Multilayered Structures edited by Dhez, P. and Weisbuch, C. (Plenum Press, New York, 1988).Google Scholar
43Chambers, S. A., Wagener, J. J., and Weaver, J. H., Phys. Rev. B 36, 8992 (1987).Google Scholar
44Steigerwald, D A. and Egelhoff, W.F., Jr., Surf. Sci. 192 L887 (1987).Google Scholar
45Macedo, W. A. A. and Keune, W., Phys. Rev. Lett. 61 475 (1988).Google Scholar
46Liu, C., Moog, E. R., and Bader, S. D., Phys. Rev. Lett. 60, 2422 (1988).Google Scholar
47Stampanoni, M., Vaterlaus, A., Aeschlimann, M., Meier, F., and Pescia, D., J. Appl. Phys. 64, 5321 (1988).Google Scholar
48Liu, C. and Bader, S.D., Physica B 161 253 (1989).Google Scholar
49Blugel, S., Weinert, M., and Dedericks, P. H., Phys. Rev. Lett. 60, 1077 (1988).Google Scholar
50Allan, G., Surf. Sci. 74 79 (1978).Google Scholar
51Grempel, D. R., Phys. Rev. B 24, 3928 (1981).Google Scholar
52Victora, R. H. and Falicov, L. M., Phys. Rev. B 31 7335 (1985).Google Scholar
53Prinz, G. A., Phys. Rev. Lett. 54 1051 (1985).Google Scholar
54Takahashi, T. and Bassett, W. A., Science 145, 483 (1964).Google Scholar
55Moruzzi, V.L., Marcus, P.M., Schwarz, K., and Mohn, P., Phys. Rev. B 34,1784 (1986); Marcus, P. M., Moruzzi, V. L., Wang, Z. Q., Li, Y. S., and Jena, F., in Physical and Chemical Properties of Thin Metal Overlayers and Alloy Surfaces (Proc. Mater. Res. Soc. Symp.), edited by D. M. Zener and D.W. Goodman (Materials Research Society, Pittsburgh, PA, 1987), Vol. 83, p. 21.Google Scholar
56Prinz, G.A., Jonker, B.T., Krebs, J. J., Ferrari, J. M., and Kovanis, F., Appl. Phys. Lett. 48 1756 (1986).Google Scholar
57Ruckman, M.W., Joyce, J. J., and Weaver, J. J., Phys. Rev. B 33, 7029 (1986).Google Scholar
58Weller, D. and Alvarado, S. F., J. Appl. Phys. 59, 2908 (1986).Google Scholar
59Kwo, J., McWhan, D. B., Hong, M., Gyorgy, E. M., Feldman, L. C., and Cunningham, J. E., in Layered Structures, Epitaxy and Interfaces (Proc. Mater. Res. Soc. Symp.), edited by Gibson, J. M. and Dawson, L. R. (Materials Research Society, Pittsburgh, PA, 1985), Vol. 37, p. 509.Google Scholar
60Homma, H., Yang, K., and Schuller, I. K., Phys. Rev. B 36, 9435 (1987).Google Scholar
61Rhyne, J. J., Erwin, R.W., Salamon, M. B., Sinha, S., Borchers, J., Cunningham, J. E., and Flynn, C. P., J. Less-Common Metals 148, 17 (1989).Google Scholar
62Majkrzak, C.F., Gibbs, D., Boni, P., Goldman, A.I., Kwo, J., Hong, M., Hsieh, T. C., Fleming, R. M., McWhan, D. B., Cable, J.W., Bohr, J., Grimm, H., and Chien, C.L., J. Appl. Phys. 63, 3447 (1988).Google Scholar
63Kwo, J., in Thin Film Growth Techniques for Low-Dimensional Structures edited by Farrow, R.F.C., Parkin, S.S.P., Dobson, P. J., Neave, J. H., and Arrott, A. S., NATO ASI Series B (Plenum, New York 1987), Vol. 163, p. 337.Google Scholar
64Du, R., Tsui, F., and Flynn, C. P., Phys. Rev. B 38, 2941 (1988).Google Scholar
65Flynn, C.P., Tsui, F., Salamon, M. B., Erwin, R.W., and Rhyne, J. J, J. Phys.: Condensed Matter 1, 5997 (1989).Google Scholar
66 See, for instance, Bruce, L. A. and Jaeger, H., Phil. Mag. A 38, 223 (1978).Google Scholar
62Yang, K.Y., Homma, H., and Schuller, I. K., J. Appl. Phys. 63, 4066 (1988).Google Scholar
68 See various articles in Mater. Res. Soc. Bull. XIV (1989).Google Scholar
69Berkowitz, A. E. and Grenier, J. H., J. Appl. Phys. 36 3330 (1965); J. Bransky, I. Bransky, and A. A. Hirsch, J. Appl. Phys. 41 183 (1970).Google Scholar
70Alexander, K. B., Walker, F. J., McKee, R. A., and List, F. A., submitted to the Am. Ceram. Soc; R.A. McKee, F. A. List, F. J. Walker, and J.R. Conner, submitted to Phys. Rev. B.Google Scholar
71Berkowitz, A. (private communication).Google Scholar
72Prinz, G. A., Mater. Res. Soc. Bull. XIII 2 (1988).Google Scholar
73Bader, S. D., in Proc. IEEE, Special Issue on Magnetics edited by R. M. White (IEEE, New York, 1990), in press.Google Scholar
74Victora, R. H. and Falicov, L. M., Phys. Rev. B 30, 259 (1984).Google Scholar
75Freeman, A. J. and Fu, C. L., in Magnetic Properties of Low-Dimensional Systems edited by Falicov, L. M. and Morá-López, J. L. (Springer-Verlag, Berlin-Heidelberg-New York-Tokyo, 1986), p. 16.Google Scholar
76Wang, D. S., Freeman, A. J., and Krakauer, H., Phys. Rev. B 24 1126 (1981).Google Scholar
77Falicov, L.M., Victora, R. H., and Tersoff, J., in The Structure of Surfaces edited by Van Hove, M. A. and Tong, S.Y. (Springer-Verlag, Berlin-Heidelberg-New York-Tokyo, 1985), p. 12, and references therein.Google Scholar
75Victora, R.H. and Falicov, L.M., Phys. Rev. B 31, 7335 (1985).Google Scholar
79Klebanoff, L. E., Victora, R. H., Falicov, L. M., and Shirley, D. A., Phys. Rev. B 32 1997 (1985).Google Scholar
80Tersoff, J. and Falicov, L. M., Phys. Rev. B 26 6186 (1982).Google Scholar
81Victora, R. H., Ishida, S., and Falicov, L. M., Phys. Rev. B 30,3896 (1984).Google Scholar
82Hasegawa, H., J. Phys. F: Met. Phys. 16 1555 (1986).Google Scholar
83Meiklejohn, W. H. and Bean, C. P., Phys. Rev. B 102 1413 (1959).Google Scholar
84 See, for example, Stoecklin, W., Parkin, S.S. P., and Scott, J. C., Phys. Rev. B 38 6854 (1988), and references therein.Google Scholar
85Yelon, A., in Physics of Thin Films edited by Francombe, M. and Hoffmann, R. (Academic Press, New York, 1971), Vol. 6, p. 205.Google Scholar
86Malozemoff, A. P., Phys. Rev. B 35, 3679 (1987); J. Appl. Phys. 63, 3874 (1988).Google Scholar
87Hermsmeier, B., Osterwalder, J., Friedman, D., and Fadley, C. S., Phys. Rev. Lett. 62, 478 (1989).Google Scholar
88Parkin, S. S. P. and Speriosu, V. S., in Magnetic Properties of Low-Dimensional Systems Proc. of the 2nd Int. Workshop held in San Luis Potosí, Mexico, May 22–26, 1989, edited by L. M. Falicov and J. L. Moŕan-López (Springer-Verlag, Heidelberg-Berlin-New York-Tokyo, 1989) (in press).Google Scholar
89Heinrich, B., Purcell, S.T., Dutcher, J. R., Urquhart, K. B., Cochran, J. F, and Arrott, A. S., Phys. Rev. 38 12879 (1988).Google Scholar
90Nakatani, R., Kobayashi, T., Ootomo, S., and Kumusaka, N., Jpn.J. Appl. Phys. 27, 937 (1988).Google Scholar
91Aeschlimann, M., Ph.D. Dissertation, ETH 8863 (1989); M. Aeschlimann, G. L. Bona, F. Meier, M. Stampanoni, A. Vaterlaus, H. C.Siegmann E. E. Marinero, and H.Notarys, IEEE Trans. Mag. MAG–24, 3180 (1988).Google Scholar
92Cain, W. C., Lee, J.W., Koeppe, P.V., and Kryder, M. H., IEEE Trans. Mag. MAG-24, 2609 (1988).Google Scholar
93Kobayashi, T., Tsuji, H., Tsunashima, S., and Uchiyama, S., Jpn. I.Appl. Phys. 20, 2089 (1981).Google Scholar
94Carbone, C. and Alvarado, S. F., Phys. Rev. B 36, 2433 (1987).Google Scholar
95Griinberg, P., Schreiber, R., Pang, Y., Brodsky, M. B., and Sowers, H., Phys. Rev. Lett. 57, 2442 (1986); F. Saurenbach, U. Walz, L. Hinchey, P. Griinberg, and W. Zinn, J. Appl. Phys. 63, 3473 (1988).Google Scholar
96Baibich, M. N., Broto, J. M., Fert, A., Nguyen Van Dau, F., Petroff, F., Etienne, P., Creuzet, G., Friederich, A., and Chazelas, J., Phys. Rev. Lett. 61, 2472 (1988).Google Scholar
97Jonker, B.T., Walker, K. H., Kisker, E., Prinz, G.A., and Carbone, C.,Phys. Rev. Lett. 57, 142 (1986).Google Scholar
98Gutierrez, C.J., Mayer, S. H., Qiu, Z.Q., Tang, H., and Walker, J. C., in Growth, Characterization and Properties of Ultrathin Magnetic Films and Multilayers (Proc. Mater. Res. Soc. Symp.), edited by Jonker, B.T., Marinero, E. E., and Heremans, J. P. (Materials Research Society, Pittsburgh, PA, 1989), Vol. 151, p. 17.Google Scholar
99Mathon, J., Rep. Prog. Phys. 51 1 (1988).Google Scholar
100Mathon, J. and Ahmad, S. B., Phys. Rev. B 37, 660 (1988);Google Scholar
101Mauri, D., Scholl, D., Siegmann, H. C., and Kay, E., Phys. Rev. Lett. 62, 1900 (1988).Google Scholar
102Moodera, J. S. and Meservey, R., Phys. Rev. B34, 379 (1986).Google Scholar
103Slonczewski, J. C., Phys. Rev. B39, 6995 (1988).Google Scholar
104Julliere, M., Phys. Lett. 54A, 225 (1975).Google Scholar
105Tedrow, P. M. and Meservey, R., Phys. Rev. B7, 318 (1973).Google Scholar
106Gaefvert, U. and Maekawa, S., IEEE Trans. Mag. MAG–18, 707 (1982).Google Scholar
107Majkrzak, C. F., Cable, J. W., Kwo, J., Hong, M., McWhan, D. B., Yafet, Y., Waszczak, J. V., and Vettier, C., Phys. Rev. Lett. 56, 2700 (1986).Google Scholar
108Salamon, M. B., Sinha, S., Rhyne, J. J., Cunningham, J. E., Erwin, R. W., Borchers, J., and Flynn, C. P., Phys. Rev. Lett. 56, 259 (1986).Google Scholar
109Yafet, Y., Kwo, J., Hong, M., Majkrzak, C. F., and O'Brien, T., J. Appl. Phys. 63, 3453 (1988).Google Scholar
110Borchers, J. A., Nieuwenhuys, G., Salamon, M. B., Flynn, C. P., Du, R., Erwin, R. W., and Rhyne, J. J., J. de Physique 49–C3, 1685 (1988).Google Scholar
111 See, for instance, Schuller, I. K. and Homma, H., Mater. Res. Soc. Bull. XII, 1 (1987).Google Scholar
112Colvard, C., Merlin, R., Klein, M. V., and Gossard, A. C., Phys. Rev. Lett. 45, 298 (1980).Google Scholar
113 See, for instance, Sokoloff, J., Solid State Commun. 40, 633 (1981).Google Scholar
114van Gelder, A. P., Phys. Rev. 181, 7887 (1969).Google Scholar
115Camley, R. E., Rahman, T. S., and Mills, D., Phys. Rev. B27, 261 (1983).Google Scholar
116Kueny, A., Khan, M. R., Schuller, I. K., and Grimsditch, M., Phys. Rev. B29, 2879 (1984).Google Scholar
117“Panel Report on Fundamental Issues in Heteroepitaxy”, Monterey, CA, January 1989 (to be published).Google Scholar
118Flanders, P. J., J. Appl. Phys. 63, 3940 (1988).Google Scholar
119Moog, E. R. and Bader, S. D., Superlatt. Microstr. 1, 543 (1985).Google Scholar
120Urquhart, K. B., Heinrich, B., Cochran, J. F., Arrott, A. S., and Myrtle, K., J. Appl. Phys. 64, 5335 (1988).Google Scholar
121Farle, M. and Baberschke, K., Phys. Rev. Lett. 58, 511 (1987).Google Scholar
122Frey, Th., Jantz, W., and Stibal, S., J. Appl. Phys. 64, 6002 (1988).Google Scholar
123 See Bloomberg, D. S. and Connell, G. A. N., in Magnetic Recording, Vol. II: Computer Data Storage, edited by Mee, C. D. and Daniel, E. D. (McGraw-Hill, New York, 1988).Google Scholar
124Schmidt, F., Rave, W., and Hubert, A., IEEE Trans. Magn. MAG–21, 1596 (1985).Google Scholar
125Herman, D. A., Jr. and Argyle, B. E., IEEE Trans. Magn. MAG–22, 772 (1986).Google Scholar
126Liu, C. and Bader, S. D., in Magnetic Properties of Low Dimensional Systems II, edited by Falicov, L. M., Mejía-Lira, F., and Morán-López, J. L. (Springer-Verlag, Berlin, 1990), p. 22.Google Scholar
127Reim, W., J. Magn. Magn. Mat. 58, 1 (1986).Google Scholar
128Hübner, W. and Bennemann, K. H., “Nonlinear Magneto-Optical Kerr Effect at the Nickel Surface,” preprint submitted for publication.Google Scholar
129Shen, Y. R., in Chemistry and Structure at Interfaces: New Laser and Optical Techniques, edited by Hall, R. B. and Ellis, A. B. (Verlag Chemie, Weinheim, 1986), p. 151.Google Scholar
130Hillebrands, B., Baumgart, P., and Güntherodt, G., Phys. Rev. B36, 2450 (1987).Google Scholar
131Grimsditch, M., Malozemoff, A., and Brunsch, A., Phys. Rev. Lett. 43, 711 (1979).Google Scholar
132Griinberg, P., Schreiber, R., Pang, Y., Brodsky, M. B., and Sowers, H., Phys. Rev. Lett. 57, 2442 (1986).Google Scholar
133Heinrich, B., Arrott, A. S., Cochran, J. F., Liu, C., and Myrtle, K., J. Vac. Sci. Technol. A4, 1376 (1986).Google Scholar
134Campagna, M., Pierce, D. T., Meier, F., Sattler, K., and Siegmann, H. C., Adv. Electronics and Electron Phys. 41, 113 (1976).Google Scholar
135Kisker, E., Schroeder, K., Gudat, W., and Campagna, M., Phys. Rev. B31, 329 (1985).Google Scholar
136Johnson, P. D., Clarke, A., Brookes, N. B., Hulbert, S. L., Sinkovic, B., and Smith, N. V., Phys. Rev. Lett. 61, 2257 (1988).Google Scholar
137Weller, D., Alvarado, S. F., Gudat, W., Schröder, K., and Campagna, M., Phys. Rev. Lett. 54, 1555 (1985).Google Scholar
138Carbone, C. and Kisker, E., Solid State Commun. 65, 1107 (1988).Google Scholar
139Kakehashi, Y., Phys. Rev. B31, 7482 (1985).Google Scholar
140Taborelli, M., Allenspach, R., Boffa, G., and Landolt, M., Phys. Rev. Lett. 56, 2869 (1986).Google Scholar
141Van Hove, M. A. and Tong, S. Y., Surface Crystallography (Springer-Verlag, Berlin-Heidelberg-New York-Tokyo, 1979).Google Scholar
142 For an overview of spin-polarized electron spectroscopy techniques see, for example, Polarized Electrons in Surface Physics, edited by Feder, R. (World Scientific, Singapore, 1985).Google Scholar
143Pierce, D. T., Celotta, R. J., Unguris, J., and Siegmann, H. C., Phys. Rev. B 26, 2566 (1982).Google Scholar
144Alvarado, S. F., Campagna, M., and Hopster, H., Phys. Rev. Lett. 48, 51 (1982).Google Scholar
145Dürr, W., Taborelli, M., Paul, O., Germar, R., Gudat, W., Pescia, D., and Landolt, M., Phys. Rev. Lett. 62, 206 (1989).Google Scholar
146 See the article by Gradmann, U. and Alvarado, S. F. in Ref. 141.Google Scholar
147Pierce, D. T., Celotta, R. J., Wang, G-C., Unertl, W. N., Galejs, A., Kuyatt, C. E., and Mielczarek, S. R., Rev. Sci. Instrum. 51, 478 (1980).Google Scholar
148Penn, D. R., Apell, S. P., and Girvin, S. M., Phys. Rev. B32, 7753 (1985).Google Scholar
149Abraham, D. L. and Hopster, H., Phys. Rev. Lett. 58, 1352 (1987).Google Scholar
150Mauri, D., Scholl, D., Siegmann, H. C., and Kay, E., Phys. Rev. Lett. 62, 1900 (1989).Google Scholar
151Venus, A. and Kirscher, J., Phys. Rev. B37, 2199 (1988); Y. U. Idzerda, D. M. Lind, D. A. Papaconstantopoulos, G. A. Prinz, B. T. Jonker, and J. J. Krebs, Phys. Rev. Lett. 61, 1222 (1988); D. L. Abraham and H. H. Hopster, Phys. Rev. B62, 1157 (1989).Google Scholar
152Abraham, D. L., Ph.D. Thesis, University of California, Irvine, CA (1989) (unpublished research).Google Scholar
153Onellion, M., Hart, M. W., Dunning, F. B., and Walters, G. K., Phys. Rev. Lett. 52, 380 (1984).Google Scholar
154Rau, C., Schneider, C., Xing, G., and Jamison, K., Phys. Rev. Lett. 57, 3221 (1986).Google Scholar
155Gidley, D. W., Köymen, A. R., and Capehart, T. W., Phys. Rev. Lett. 49, 1779 (1982).Google Scholar
156Unguris, J., Pierce, D. T., and Celotta, R. J., Rev. Sci. Instrum. 57, 1314 (1986).Google Scholar
157Hembree, G. G., Unguris, J., Celotta, R. J., and Pierce, D. T., Scanning Microscopy Supplement 1, 229 (1987).Google Scholar
158Pierce, D. T., Unguris, J., and Celotta, R. J., Mater. Res. Soc. Bull. 13, 19 (1988).Google Scholar
159Scheinfein, M. R., Pierce, D. T., Unguris, J., McClelland, J. J., Celotta, R. J., and Kelley, M. H., Rev. Sci. Instrum. 60, 1 (1989).Google Scholar
160Pierce, D. T., Scheinfein, M. R., Unguris, J., and Celotta, R. J., in Growth, Characterization and Properties of Ultrathin Magnetic Films and Multilayers (Proc. Mater. Res. Soc. Symp.), edited by Jonker, B. T., Marinero, E. E., and Heremans, J. P. (Materials Research Society, Pittsburgh, PA, 1989), Vol. 151, p. 49.Google Scholar
161Joy, D. C. and Jacubovics, J. P., J. Phys. D2, 1367 (1969).Google Scholar
162Tonomura, A., Matsuda, T., Endo, J., Arii, T., and Mihama, K., Phys. Rev. Lett. 44, 1430 (1980).Google Scholar
163Dekkers, N. H. and deLang, H., Optik 41, 452 (1974).Google Scholar
164Chapman, J. N. and Morrison, G. R., J. Magn. Magn. Mat. 35, 254 (1983).Google Scholar
165Tsuno, K., Rev. Solid State Sci. 2, no. 4, 623 (1988).Google Scholar
166Pierce, D. T., Physica Scripta 38, 291 (1988).Google Scholar
167Martin, Y., Rugar, D., and Wiskramasinghe, H. K., Appl. Phys. Lett. 52, 244 (1988).Google Scholar
168Hartmann, U., J. Appl. Phys. 64, 1561 (1988).Google Scholar
169 For recent reviews see, for instance, the various chapters in Interfaces, Superlattices and Thin Films (Proc. Mater. Res. Soc. Symp.), edited by Dow, J. D. and Schuller, I. K. (Materials Research Society, Pittsburgh, PA, 1987), Vol. 77.Google Scholar
170 See, for instance, McWhan, D. B., chapter in Ref. 169.Google Scholar
171 See, for instance, Spiller, E., chapter in Ref. 169.Google Scholar
172 See, for instance, various articles in Multilayers: Synthesis, Properties and Non-Electronic Application (Proc. Mater. Res. Soc. Symp.), edited by Barbee, T. W., Jr., Spaepen, F., and Greer, L. (Materials Research Society, Pittsburgh, PA, 1988), Vol. 103.Google Scholar
173 See, for instance, Locquet, J. P., Neerink, D., Sevenhans, W., Bruynseraede, Y., Homma, H., and Schuller, I. K., chapter in Ref. 172, p. 211.Google Scholar
174Schuller, I. K., Bruynseraede, Y., Fullerton, E., and Vanderstraeten, H. (to be published).Google Scholar
175Rhyne, J. J., Erwin, R. W., Borchers, J., Salamon, M. B., Du, R., and Flynn, C. P., Physica B159, 111 (1989).Google Scholar
176Felcher, G. P., Hilleke, R. O., Crawford, R. K., Hanmann, J., Kleb, R., and Ostowski, G., Rev. Sci. Instrum. 58, 609 (1987).Google Scholar
177Parkin, S. S. P., Sigsbee, R., Felici, R., and Felcher, G. P., Appl. Phys. Lett. 48, 604 (1986).Google Scholar
178Toney, M. F., Huang, T. C., Brennan, S., and Rek, Z., J. Mater. Res. 3, 351 (1988).Google Scholar
179Parkin, S. S. P., Deline, V., Hilleke, R., and Felcher, G. P., private communication and submitted to Phys. Rev. B.Google Scholar
180Bland, J. A. C. and Willis, R. F., in Thin Film Growth Techniques for Low-Dimensional Structures, edited by Farrow, R. F. C., Parkin, S. S. P., Dobson, P. J., Neave, J. H., and Arrott, A. S., NATO ASI Series B (Plenum, New York, 1987), Vol. 163, p. 405.Google Scholar
181Zabel, H. (private communication).Google Scholar
182Eberhardt, W. and Fadley, C. S., “Summary of the Workshop on New Opportunities in Surface Science at the Advanced Light Source,” Lawrence Berkeley Laboratory Publication 5215, September 1988.Google Scholar
183Brau, C. A., Science 239, 1115 (1988).Google Scholar
184Free Electron Laser Applications in the Ultraviolet (Optical Society of America, Washington, DC, 1988).Google Scholar
185 See Bader, S. D., in Ref. 184, p. 20.Google Scholar
186Bader, S. D., in Proc. of the First Users Meeting for the Advance Photon Source, Argonne National Laboratory, APS-CP-1, November 1986.Google Scholar
187Sinkovic, B., Hermsmeier, B., and Fadley, C. S., Phys. Rev. Lett. 55, 1227 (1985).Google Scholar
188Marra, W. C., Eisenberger, P., and Cho, A. Y., J. Appl. Phys. 50, 6927 (1979); W. C. Marra, P. H. Fuoss, and P. Eisenberger, Phys. Rev. Lett. 49, 1169 (1982).Google Scholar
189Gibbs, D., Moncton, D. E., D'Amico, K. L., Bohr, J., and Grier, B. H., Phys. Rev. Lett. 55, 234 (1985).Google Scholar
190Vettier, C., McWhan, D. B., Gyorgy, E. M., Kwo, J. R., Buntschuh, B. M., and Batterman, B. W., Phys. Rev. Lett. 56, 757 (1985).Google Scholar
191Blume, M., J. Appl. Phys. 57, 3615 (1985).Google Scholar
192Rogers, D. J., Chapman, J. N., Bernards, J. P. C., and Luitjens, S. B., IEEE Trans. Mag. MAG–25, 4180 (1989); K. Hono and D. E. Laughlin, J. Magn. Magn. Mater. 80, L137 (1989).Google Scholar
193Lin, T., Alani, R., and Lambeth, D. N., J. Magn. Magn. Mater. 78, 213 (1989).Google Scholar
194Christner, J. A., Ranjan, R., Peterson, R. L., and Lee, J. I., J. Appl. Phys. 63, 3260 (1988).Google Scholar
195Natarajan, B. R. and Murdock, E. S., IEEE Trans. Mag. MAG–24, 2724 (1988).Google Scholar
196Zeper, W. B., Greidanus, F. J. A. M., Carcia, P. F., and Fincher, C. R., J. Appl. Phys. 65, 4971 (1989).Google Scholar
197Cain, W. C., Markham, D. C., and Kryder, M. H., IEEE Trans. Mag. MAG–25, 3695 (1989).Google Scholar
198Cadieu, F. J., Hedge, H., and Chen, K., IEEE Trans. Mag. MAG–25, 3788 (1989).Google Scholar
199Wallace, W. E., Progress in Solid State Chem. 16, 127 (1985).Google Scholar
200Bagno, P., Jepsen, O., and Gunnarson, O., Phys. Rev. Lett. 40, 1997 (1989).Google Scholar
201Liu, C. and Bader, S. D., Phys. Rev. B41, 553 (1990).Google Scholar
202Mauri, D., Scholl, D., Siegmann, H. C., and Kay, E., Phys. Rev. Lett. 61, 758 (1988).Google Scholar
203Rado, G. T., Bull. Am. Phys. Soc. 2, 127 (1957).Google Scholar
204Mills, D. L. and Maradudin, A. A., J. Phys. Chem. Solids 28, 1855 (1967).Google Scholar
205Grünberg, P. and Mika, K., Phys. Rev. B27, 2955 (1983); K. Mika and P. Grunberg, Phys. Rev. B 31, 4465 (1985).Google Scholar
206Grimsditch, M., Khan, M. R., Kueny, A., and Schuller, I. K., Phys. Rev. Lett. 51, 498 (1983).Google Scholar
207Morrison, A., Kang, M. H., and Mele, E. J., Phys. Rev. B39, 1575 (1989).Google Scholar
208Arrott, A. S., Heinrich, B., and Aharoni, A., IEEE Trans. Magn. MAG–15, 1228 (1979).Google Scholar
209Vlaming, R. and van den Berg, H. A. M., J. Appl. Phys. 63, 4330 (1988).Google Scholar
210Yafet, Y. and Gyorgy, E. M., Phys. Rev. B38, 9145 (1988).Google Scholar
211Webb, B. C. and Schultz, S., IEEE Trans. Mag. MAG–24, 3006 (1988).Google Scholar
212Kubo, O., Ido, T., Yokoyama, H., and Koike, Y., J. Appl. Phys. 57 4280 (1985).Google Scholar
213Victora, R. H., J. Appl. Phys. 63, 3423 (1988); Phys. Rev. Lett. 63, 457 (1989).Google Scholar
214Berkowitz, A. E., Parker, F. E., Hall, E. L., and Podolsky, G., IEEE Trans. Mag. MAG–24, 2871 (1988). 457 (1989).Google Scholar