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A study of laser marking of thin films

Published online by Cambridge University Press:  31 January 2011

Mool C. Gupta
Mool C. Gupta
Affiliation:
Research Laboratories, Diversified Technology Group, Eastman Kodak Company, Rochester, New York 14650
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Abstract

Some observations of laser marking of thin films are presented. Time-resolved reflectivity measurements performed during laser marking of thin organic films indicate that the pit-formation processes start in less than 10 ns after the onset of the laser pulse and that some reversal of the process occurs following exposure termination. Temperature calculations for laser heating of thin films with focused scanning beams explain some of the mark (pit) morphology and material flow behavior that is observed. Scanning electron microscopy (SEM) studies of the marks indicate that at high laser powers, pit formation occurs by ablation and at low laser powers, pits can be formed without ablation. Pits were also formed in a 100nm thin film by resistive heating where the maximum temperature was less than 300 °C.

Type
Articles
Information
Journal of Materials Research , Volume 3 , Issue 6 , December 1988 , pp. 1187 - 1195
Copyright
Copyright © Materials Research Society 1988

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References

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