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Structural phase evolution of strontium-doped lead titanate thin films prepared by the soft chemical technique

  • F. M. Pontes (a1), S. H. Leal (a2), P. S. Pizani (a3), M. R. M. C. Santos (a4), E. R. Leite (a1), E. Longo (a1), F. Lanciotti (a3), T. M. Boschi (a3) and J. A. Varela (a5)...

Abstract

Strontium-modified lead titanate thin films with composition Pb1−xSrxTiO3 were grown on Pt/Ti/SiO2/Si substrates using the polymeric precursor method. The structural phase evolution as a function of the Sr contents was studied using micro-Raman scattering, specular reflectance infrared Fourier transform spectroscopy, and x-ray diffraction. The results showed a gradual change from tetragonal to cubic structure, the transition occurring at about x = 0.58. The infrared reflectance spectra showed that the frequency of several peaks decreases as the strontium concentration increases. These features are correlated with a decrease in the tetragonal distortion of the TiO6 octahedra as the strontium concentration increases.

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a)Address all correspondence to this author. e-mail: liec@power.ufscar.br

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Structural phase evolution of strontium-doped lead titanate thin films prepared by the soft chemical technique

  • F. M. Pontes (a1), S. H. Leal (a2), P. S. Pizani (a3), M. R. M. C. Santos (a4), E. R. Leite (a1), E. Longo (a1), F. Lanciotti (a3), T. M. Boschi (a3) and J. A. Varela (a5)...

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