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Structural and Electronic Properties of (CdTe)1−x(In2Te3)x Films Grown by Close-spaced vapor Transport Combined with Free Evaporation

  • M. Zapata-Torres (a1), Y. P. Mascarenhas (a2), M. A. Santana-Aranda (a3), J. Luyo-Alvarado (a3), M. Melé-Lirandez (a3), A. Zapata-Navarro (a4), S. Jimé-Sandovalnez (a5), R. Castro-Rodriguez (a6) and J. L. Peña (a7)...

Abstract

The structural and electronic properties of (CdTe)1−x(In2Te3)x thin films as a function of substrate temperature were studied using x-ray diffraction, energy dispersive x-ray analysis, and Raman, transmission, and modulated transmission spectroscopies. The films were grown by the close-spaced vapor transport technique combined with free evaporation; CdTe and In2Te3 were used as sources. From x-ray diffraction the presence of mixed phases and differences in composition were detected, and good correlation with Raman spectroscopy was found. Transmission spectroscopy suggested the possibility of a modulation of the band gap of the alloy from a value as low as 0.5 eV up to 1.5 eV. Single-phase films presented a direct band gap of around 1.15 eV, as obtained from modulated transmission measurements.

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1.Mason, D.R. and O'Kane, D.F., Proceedings of the International Conference on Semiconductor Physics, Prague 1960 (Czechoslovak Academy of Science, Prague, Czechoslovakia, 1961), p. 1025.
2.O'Kane, D.F. and Mason, D.R., J. Electrochem. Soc. 110, 1132 (1963).
3.Gurevich, Y.G., Koskhin, V.M., and Volovichev, I.N., Solid-State Electron. 38, 235 (1995).
4.Volovichev, I.N., Gurevich, Y.G., and Koskhin, V.M., Microelectron. J. 29, 535 (1999).
5.Iwamura, Y., Jpn. J. Appl. Phys. 16, 1489 (1977).
6.Iwamura, Y. and Moriyama, M., Jpn. J. Appl. Phys. 20, 2435 (1981).
7.Weitze, D. and Leute, V., J. Alloys Comp. 236, 229 (1996).
8.Castro-Rodríguez, R., Rodríguez-Castellanos, C., Zapata-Torres, M., Zapata-Navarro, A., Mustre de León, J., Oliva, A.I., and Peña, J.L., Rev. Mex. Fis. 41, 396 (1995).
9.Zapata-Torres, M., Castro-Rodríguez, R., Melendez-Lira, M., Jimenez-Sandoval, S., Zapata-Navarro, A., and Peña, J.L., Thin Solid Films 358, 12 (2000).
10.Larson, A.C. and Von Dreele, R.B., GSAS, Generalized Structure Analysis System, Document LAUR 86–748 (Los Alamos National Laboratory, Los Alamos, NM, 1993).
11.Hahn, H., Günter, F., Wilhelm, K., Störger, A.D., and Stöerger, G., Z. Anorg. Allg. Chem. 279, 241 (1955).
12.Chattopadhyay, T., Santandrea, R.P., and von Schnerong, H.G., J. Phys. Chem. Solids 46, 351 (1985).
13.Lambert, J.F., Huong, P.V., Limtrakul, J., and Launay, J.C., J. Mol. Struct. 294, 159 (1993).
14.Nizametdinova, M.A., Phys. Status Solidi (b) 97, K9 (1980).
15.Islam, S.S., Rath, S., Jain, K.P., Abbi, S.C., Julien, C., and Balkanski, M., Phys Rev. B 46, 4982 (1992).
16.Pankove, J.I., Optical Processes in Semiconductors (Dover, New York, 1971).
17.Aspnes, D.E., in Handbook of Semiconductors, edited by Moss, T.S. (North Holland, New York, 1980), Vol. 2.
18.Irribarren, A., Riech, I., Hernández, M.P., Castro-Rodríguez, R., Peña, J.L., and Zapata-Torres, M., J. Vac. Sci. Technol. A 17, 3433 (1999).

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