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Relative effects of Pb and Re doping in Hg-1223 thick films grown on Ag substrates

Published online by Cambridge University Press:  03 March 2011

J.H. Su ,
P.V.P.S.S. Sastry  and
J. Schwartz
J.H. Su*
Affiliation:
National High Magnetic Field Laboratory, Tallahassee, Florida 32310; and Department of Mechanical Engineering, Florida Agricultural and Mechanical University-Florida State University College of Engineering, Tallahassee, Florida 32310
P.V.P.S.S. Sastry
Affiliation:
Center for Advanced Power Systems, Tallahassee, Florida 32310
J. Schwartz
Affiliation:
National High Magnetic Field Laboratory, Tallahassee, Florida 32310; Department of Mechanical Engineering, Florida Agricultural and Mechanical University-Florida State University College of Engineering, Tallahassee, Florida 32310; and Center for Advanced Power Systems, Tallahassee, Florida 32310
*
a)Address all correspondence to this author. e-mail: jhsu@magnet.fsu.edu
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Abstract

The relative effects of Pb and Re doping on microstructure, irreversibility field, and electronic anisotropy of HgBa2Ca2Cu3O8+δ (Hg-1223) thick films grown on Ag substrates prepared by dip-coating were studied. Both Pb- and Re-doped films exhibit the dominant phase of Hg-1223, characterized by a superconducting transition temperature (Tc) of 133 K. Both dopants distribute homogeneously in the Hg-1223 grains and promote grain growth. Pb-doped films have larger colony size compared to the Re-doped. The irreversibility fields (Hirr) of (Hg,Re)-1223 are significantly higher than those of (Hg,Pb)-1223 at temperatures below 100 K. The logarithmic plots of Hirr versus (1 – T/Tc) show both Pb- and Re-doped have a crossover temperature reflecting a transition from two- to three-dimensional behavior with increasing temperature. Re doping significantly decreases the electronic anisotropy γ, which would enhance flux pinning and consequently improve the critical current density. The differences between Pb and Re dopants in affecting γ are explained in terms of crystal structure.

Keywords

SuperconductorMicrostructure
Type
Articles
Information
Journal of Materials Research , Volume 19 , Issue 9 , September 2004 , pp. 2658 - 2664
Copyright
Copyright © Materials Research Society 2004

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