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Real-time synchrotron x-ray scattering study of an epitaxial BaTiO3 thin film during heating

Published online by Cambridge University Press:  31 January 2011

Sang Sub Kim  and
Jung Ho Je
Sang Sub Kim
Affiliation:
Department of Materials Science and Metallurgical Engineering, Research and Development Center for Automobile's Parts and Materials, Sunchon National University, Chonnam, Sunchon 540–742, Korea
Jung Ho Je
Affiliation:
Department of Materials Science and Engineering, Pohang University of Science and Technology, Pohang 790–784, Korea
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Abstract

An epitaxial BaTiO3 film with 290-nm thickness was prepared on a MgO(001) single-crystal substrate by radio-frequency magnetron sputter deposition. The structural characteristics of the film were studied as a function of temperature in in situ, real-time synchroton x-ray scattering experiments. We found that the as-grown film was strained at room temperature and tetragonally distorted with the c axis normal to the film surface. Interestingly, its lattice parameters were found to be expanded 1.28% and 0.64% in both the in-plane and the out-of-plane directions, respectively (i.e., biaxially), comparing to those of a bulk BaTiO3. More importantly, as it was heated to 600 °C, the tetragonal structure was kept up without the phase transition, which is usually observed in other epitaxial ferroelectric thin films.

Type
Articles
Information
Journal of Materials Research , Volume 14 , Issue 9 , September 1999 , pp. 3734 - 3738
Copyright
Copyright © Materials Research Society 1999

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