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Preparation and microstructure of SrCuO2/(Sr0.5Ca0.5)CuO2 epitaxial multilayers with the infinite-layer structure

Published online by Cambridge University Press:  03 March 2011

Toshifumi Satoh
Affiliation:
Central Research Laboratories, Matsushita Electric Industrial Co., Ltd., 3–4, Hikaridai, Seika-cho, Soraku-gun, Kyoto 619-02, Japan
Hideaki Adachi
Affiliation:
Central Research Laboratories, Matsushita Electric Industrial Co., Ltd., 3–4, Hikaridai, Seika-cho, Soraku-gun, Kyoto 619-02, Japan
Yo Ichikawa
Affiliation:
Central Research Laboratories, Matsushita Electric Industrial Co., Ltd., 3–4, Hikaridai, Seika-cho, Soraku-gun, Kyoto 619-02, Japan
Kentaro Setsune
Affiliation:
Central Research Laboratories, Matsushita Electric Industrial Co., Ltd., 3–4, Hikaridai, Seika-cho, Soraku-gun, Kyoto 619-02, Japan
Kiyotaka Wasa
Affiliation:
Central Research Laboratories, Matsushita Electric Industrial Co., Ltd., 3–4, Hikaridai, Seika-cho, Soraku-gun, Kyoto 619-02, Japan
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Abstract

Multilayer thin films of SrCuO2/(Sr0.5Ca0.5)CuO2 with an infinite-layer structure have been prepared on (100) SrTiO3 single crystals by multitarget rf magnetron sputtering. The structural analyses of the multilayers were carried out by means of x-ray diffraction (XRD), secondary ion-mass-spectroscopy (SIMS), and transmission electron microscopy (TEM). Heteroepitaxial growth of the SrCuO2 and (Sr0.5Ca0.5)CuO2 layers was confirmed to be with the c-axis perpendicular to the (100) SrTiO3 surface. The XRD and SIMS measurements revealed that the compositional modulations of the multilayer films were successfully constructed as we designed. However, in the TEM images, there existed planar dislocations parallel to the ac- and bc-planes, which went across the boundaries of the SrCuO2 and (Sr0.5Ca0.5)CuO2 layers. The resistivity of the multilayer films showed semiconductor-like behavior with temperature, and there was no relation between electric properties and modulation wavelength.

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Articles
Copyright
Copyright © Materials Research Society 1994

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References

REFERENCES

1Siegrist, T., Zahurac, S. M., Murphy, D. W., and Roth, R. S., Nature 334, 231 (1988).CrossRefGoogle Scholar
2Takano, M., Takeda, Y., Okada, H., Miyamoto, M., and Kusaka, T., Physica C 159, 375 (1989).CrossRefGoogle Scholar
3Takano, M., Azuma, M., Hiroi, Z., Bando, Y., and Takeda, Y., Physica C 176, 441 (1991).CrossRefGoogle Scholar
4Azuma, M., Hiroi, Z., Takano, M., Bando, Y., and Takeda, Y., Nature 356, 775 (1992).CrossRefGoogle Scholar
5Smith, M. G., Manthiram, A., Zhou, J., Goodenough, J. B., and Markert, J. T., Nature 351, 549 (1991).CrossRefGoogle Scholar
6Er, G., Miyamoto, Y., Kanamaru, F., and Kikkawa, S., Physica C 181, 206 (1991).CrossRefGoogle Scholar
7Adachi, S., Yamauchi, H., Tanaka, S., and Mori, N., Physica C 208, 226 (1993).CrossRefGoogle Scholar
8Yazawa, I., Terada, N., Matsutani, K., Sugise, R., Jo, M., and Ihara, H., Jpn. J. Appl. Phys. 29, L566 (1990).CrossRefGoogle Scholar
9Kanai, M., Kawai, T., and Kawai, S., Appl. Phys. Lett. 58, 771 (1991).CrossRefGoogle Scholar
10Yoshimoto, M., Nagata, H., Gong, J., Ohkubo, H., and Koinuma, H., Physica C 185–189, 2085 (1991).CrossRefGoogle Scholar
11Norton, D. P., Chakoumakos, B. C., Budai, J. D., and Lowndes, D. H., Appl. Phys. Lett. 62, 1679 (1993).CrossRefGoogle Scholar
12Adachi, H., Satoh, T., Ichikawa, Y., Setsune, K., and Wasa, K., Phys. C 196, 14 (1992).CrossRefGoogle Scholar
13Sugii, N., Kubo, K., Ichikawa, M., Yamamoto, K., Yamauchi, H., and Tanaka, S., Jpn. J. Appl. Phys. 31, L1024 (1992).CrossRefGoogle Scholar
14Niu, C. and Lieber, C. M., Appl. Phys. Lett. 61, 1712 (1992).CrossRefGoogle Scholar
15Matsushima, T., Ichikawa, Y., Adachi, H., Setsune, K., and Wasa, K., Solid State Commun. 76, 1201 (1990).CrossRefGoogle Scholar
16Siegrist, T., Schneemeyer, L. F., Sunshine, S. A., Waszczak, J. V., and Roth, R. S., Mater. Res. Bull. XXIII, 1429 (1988).CrossRefGoogle Scholar
17Takeno, S., Nakamura, S., Terashima, Y., and Miura, T., Physica C 206, 75 (1993).CrossRefGoogle Scholar
18Sugii, N., Ichikawa, M., Hayashi, K., Kubo, K., Yamamoto, K., and Yamauchi, H., Physica C 213, 345 (1993).CrossRefGoogle Scholar