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Potential oscillations during the electrochemical self-assembly of copper/cuprous oxide layered nanostructures

Published online by Cambridge University Press:  31 January 2011

Jay A. Switzer
Affiliation:
Department of Chemistry and Graduate Center for Materials Research, University of Missouri, Rolla, Rolla, Missouri 65409–1170
Chen-Jen Hung
Affiliation:
Department of Chemistry and Graduate Center for Materials Research, University of Missouri, Rolla, Rolla, Missouri 65409–1170
Ling-Yuang Huang
Affiliation:
Department of Chemistry and Graduate Center for Materials Research, University of Missouri, Rolla, Rolla, Missouri 65409–1170
F. Scott Miller
Affiliation:
Department of Chemistry and Graduate Center for Materials Research, University of Missouri, Rolla, Rolla, Missouri 65409–1170
Yanchun Zhou
Affiliation:
Department of Chemistry and Graduate Center for Materials Research, University of Missouri, Rolla, Rolla, Missouri 65409–1170
Eric R. Raub
Affiliation:
Department of Chemistry and Graduate Center for Materials Research, University of Missouri, Rolla, Rolla, Missouri 65409–1170
Mark G. Shumsky
Affiliation:
Department of Chemistry and Graduate Center for Materials Research, University of Missouri, Rolla, Rolla, Missouri 65409–1170
Eric W. Bohannan
Affiliation:
Department of Chemistry and Graduate Center for Materials Research, University of Missouri, Rolla, Rolla, Missouri 65409–1170
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Abstract

Layered nanostructures of copper metal and cuprous oxide are electrodeposited from alkaline solutions of Cu(II) lactate at room temperature. No subsequent heat treatment is necessary to effect crystallization. The electrode potential spontaneously oscillates during constant-current deposition. At a fixed current density the oscillation period decreases as either the pH or temperature is increased. The oscillations are periodic in stirred solution, but show period doubling and evidence of quasi-periodic or chaotic behavior in unstirred solution. The phase composition and resistivity of the films can be controlled by varying the applied current density. The resistivity of the films can be varied over ten orders of magnitude. Scanning electron microscopy shows that the films are layered.

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Articles
Copyright
Copyright © Materials Research Society 1998

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