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Porosity scaling strategies for low-k films

  • David J. Michalak (a1), James M. Blackwell (a1), Jessica M. Torres (a1), Arkaprabha Sengupta (a2), Lauren E. Kreno (a3), James S. Clarke (a3) and Daniel Pantuso (a4)...

Abstract

Reducing the delay of backend interconnects is critical in delivering improved performance in next generation computer chips. One option is to implement interlayer dielectric (ILD) materials with increasingly lower dielectric constant (k) values. Despite industry need, there has been a recent decrease in study and production of these materials in academia and business communities. We have generated a backbone and porogen system that allows us to control porosity from 0 to 60% volume, achieve k-values from 3.4 to 1.6, maintain high chemical stability to various wet cleans, and deliver uniquely high mechanical strength at a given porosity. Finite element modeling and experimental results demonstrate that further improvements can be achieved through control of the pore volume into an ordered network. With hopes to spur more materials development, this paper discusses some molecular design and nanoscale hierarchical principles relevant to making next generation low-k ILD materials.

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Corresponding author

a)Address all correspondence to this author. e-mail: david.j.michalak@intel.com

References

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