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Poly(vanadium–molybdenum acid) xerogel thin films fabricated by the sol-gel process and their humidity-sensing properties

Published online by Cambridge University Press:  31 January 2011

Maosong Tong
Affiliation:
Department of Electronic Engineering, National Integrated Optoelectronics Laboratory, Jilin University, Changchun 130023, China
Guorui Dai*
Affiliation:
Department of Electronic Engineering, National Integrated Optoelectronics Laboratory, Jilin University, Changchun 130023, China
Yuanda Wu
Affiliation:
Department of Electronic Engineering, National Integrated Optoelectronics Laboratory, Jilin University, Changchun 130023, China
Xiuli He
Affiliation:
Department of Electronic Engineering, National Integrated Optoelectronics Laboratory, Jilin University, Changchun 130023, China
Wei Yan
Affiliation:
Department of Electronic Engineering, National Integrated Optoelectronics Laboratory, Jilin University, Changchun 130023, China
Dingsan Gao
Affiliation:
Institute of Solid State Chemistry, Ural Branch of the Russian Academy of Sciences, 91,620291, Jekterinburg, Russia
Victor Volkov
Affiliation:
Institute of Solid State Chemistry, Ural Branch of the Russian Academy of Sciences, 91,620291, Jekterinburg, Russia
Galina Zakharova
Affiliation:
Institute of Solid State Chemistry, Ural Branch of the Russian Academy of Sciences, 91,620291, Jekterinburg, Russia
*
a)Address all correspondence to this author.grdai@mail.jlu.edu.cn
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Abstract

Thermogravimetric analysis, x-ray photoelectron spectroscopy, and x-ray diffraction results and the humidity sensing properties of poly(vanadium–molybdenum acid) H2V9.5Mo2.5O32.0 · 8.8H2O xerogel thin films, which were fabricated by the sol-gel process, are described in this paper. The conductance and the capacitance of the thin films strongly depend on the relative humidity. Different electrodes have different influences on the humidity-sensing properties of the thin films.

Type
Articles
Copyright
Copyright © Materials Research Society 2000

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References

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