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Orientation-specific amorphization and intercalated recrystallization at ion-irradiated SrTiO3/MgO interfaces

  • Jeffery A. Aguiar (a1), Mujin Zhuo (a2), Zhenxing Bi (a2), Engang Fu (a3), Yongqiang Wang (a3), Pratik P. Dholabhai (a3), Amit Misra (a4), Quanxi Jia (a4) and Blas P. Uberuaga (a5)...

Abstract

Oxide composites are a class of materials with potential uses for nuclear, space, and coating applications. Exploiting their promise, however, requires a detailed understanding of their interfacial structure and chemistry. Using analytical microscopy, we have examined the radiation damage behavior at the interface of a model oxide bilayer, SrTiO3/MgO. The as-synthesized SrTiO3 thin film contained both (100) and (110) oriented domains. We found that after ion beam implantation the (110) domains amorphized at a lower radiation fluence than the (100) domains. Further, a persistent crystalline layer of SrTiO3 forms at the interface even as the rest of the SrTiO3 film amorphizes. We hypothesize that the enhanced amorphization susceptibility of the (110) domains is a consequence of how charged irradiation-induced defects at the interfaces interact with the charged planes of the (110) domains. These results demonstrate the complex relationship between interfacial structure and radiation damage evolution at oxide interfaces.

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Corresponding author

a)Address all correspondence to this author. e-mail: jeffery.aguiar@lanl.gov

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