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Nickel-alloyed tin-lead eutectic solder for surface mount technology

Published online by Cambridge University Press:  31 January 2011

Sung K. Kang
Affiliation:
IBM Research, T.J. Watson Research Center, P.O. Box 218, Yorktown Heights, New York 10598
Thomas G. Ference
Affiliation:
IBM Technology Products, East Fishkill, Route 52, Hopewell Junction, New York 12533
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Abstract

A new ternary solder alloy of tin-lead-nickel was developed for solder joints. It has an optimum composition range of (60–65)% Sn, (35–40)% Pb, (0.5–1.0)% Ni by weight. The alloy exhibits a higher strength and longer fatigue life than the pure 63% Sn−37% Pb eutectic. Melting point, wettability, and fatigue life were the key properties used to determine this composition. In particular, the melting point of the alloyed eutectic solder did not change for rapidly solidified samples when up to 2 wt. % Ni was added. Instead of modifying the solution melting temperature, the majority of the Ni precipitated out as a fine dispersion of Ni3Sn4. These Ni3Sn4 particles help to strengthen the solder matrix. Reflow experiments on rapidly solidified material showed minimal coarsening and agglomeration of the Ni3Sn4 particles for up to 5 min of reflow cycles. The wettability of the solder, however, decreased significantly for contents of Ni above 1.5%. Low cycle fatigue tests show that for a solder with 0.5% Ni, the fatigue life was about twice as long as that of standard eutectic solder. Suggested processing for the alloy is rapid solidification to form the alloy powder which is incorporated into a reflowable paste.

Type
Articles
Copyright
Copyright © Materials Research Society 1993

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References

REFERENCES

1Mangin, C. and McClelland, S.Surface Mount Technology (IFS Ltd., United Kingdom, 1987).Google Scholar
2Lau, J. and Rice, D. Solid State Technol. October 91104 (1985).Google Scholar
3Microelectronics Packaging Handbook, edited by Tummala, R. and Rymaszewski, E. (Van Nostrand Reinhold, New York, 1989), pp. 277, 385, 909.Google Scholar
4Stark, F.IEEE Trans. CHMT 10 (2), 152158 (1987).Google Scholar
5Weinbel, R.Tien, J.Pollak, R. and Kang, S.J. Mater. Sci. 22, 39013906 (1987).CrossRefGoogle Scholar
6Hendrix, B.Tien, J.Kang, S. and Reiley, T. Proc. TMS-AIME, 139145 (1987).Google Scholar
7Sims, C. and Hagel, W.The Superalloys (John Wiley & Sons, New York, 1972), pp. 84, 197.Google Scholar
8Carbonara, R.Carbonara, R. S.Gaspar, T.A.Raman, R.V.Maringer, R.E. and McCall, J. L.State-of-the-Art Review of Rapid Solidification Technology (Battelle Columbus Lab., Columbus, OH, 1981).Google Scholar
9Kang, S.K.Metall. Trans. B12B, 620622 (1981).CrossRefGoogle Scholar
10Bader, W.G.Weld. J. 48, Res. Suppl., 551-S (1969).Google Scholar
11Cline, H. and Alden, T.Trans. TMS-AIME 239, 710 (1967).Google Scholar
12Rack, H. and Maurin, J.J. Testing and Eval. ASTM 2, 351 (1974).Google Scholar
13Lake, J. and Wild, R.28th Nat. SAMPE SYMP., Anaheim, CA (1983).Google Scholar