Hostname: page-component-7bb8b95d7b-l4ctd Total loading time: 0 Render date: 2024-09-22T01:59:06.287Z Has data issue: false hasContentIssue false
  • English
  • Français

Microstructure characterization of one-directionally oriented ulexite

Published online by Cambridge University Press:  31 January 2011

Yumi H. Ikuhara ,
Shinji Kondoh ,
Koichi Kikuta  and
Shin-ichi Hirano
Yumi H. Ikuhara
Affiliation:
Synergy Ceramics Laboratory, Fine Ceramics Research Association, 2-4-1 Mutsno, Atsuta-ku, Nagoya 456, Japan
Shinji Kondoh
Affiliation:
Synergy Ceramics Laboratory, Fine Ceramics Research Association, 2-4-1 Mutsno, Atsuta-ku, Nagoya 456, Japan
Koichi Kikuta
Affiliation:
National Industrial Research Institute of Nagoya, 1 Hirate-cho, Kita-ku, Nagoya 462, Japan
Shin-ichi Hirano
Affiliation:
Department of Applied Chemistry, School of Engineering, Nagoya University, Furo-cho, Chikusa-ku, Nagoya 464–01, Japan
Get access

Abstract

Microstructures of ulexite were investigated by CTEM and low electron dose HREM. It was found that the longitudinal grains in ulexite were oriented to c-direction to form a bundle structure. There were a number of small-angle grain boundaries and stacking faults inside a grain in the ulexite. Cleavage microcracks and stacking faults were mostly introduced on the {010} of the ulexite. The high-angle grain boundaries mainly consisted of high coincidence boundaries, which was confirmed by a comparison of observed contact angles and calculated degree of coincidence at the boundaries. The light transmittance properties of the ulexite would depend on the defects such as stacking fault, small-angle grain boundary, and high-angle grain boundary.

Type
Articles
Information
Journal of Materials Research , Volume 13 , Issue 3 , March 1998 , pp. 778 - 783
Copyright
Copyright © Materials Research Society 1998

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Kreidl, N., Ceram. Bull. 63, 1394 (1984).Google Scholar
2.Saifi, M. A., Jong, S. J., Cohen, L. G., and Stone, J., Opt. Lett. 7, 43 (1982).CrossRefGoogle Scholar
3.Etzkorn, H. and Heinlein, W. E., Electron. Lett. 20, 423 (1984).CrossRefGoogle Scholar
4.Maekawa, E. and Sumida, S., J. Lightwave Technol. Lett. 3, 829 (1985).CrossRefGoogle Scholar
5.Murdoch, J., Am. Mineral. 25, 754 (1940).Google Scholar
6.Weichel-Moore, E. J. and Potter, R. J., Nature 200, 1163 (1963).CrossRefGoogle Scholar
7.Baur, G. S. and Sand, L. B., Am. Mineral. 42, 676 (1957).Google Scholar
8.Clark, J. R. and Christ, C. L., Am. Mineral. 44, 712 (1959).Google Scholar
9.Clark, J. R. and Appleman, D. E., Science 145, 1295 (1964).CrossRefGoogle Scholar
10.Stoch, L. and Waclawska, I., J. Therm. Anal. 36, 2045 (1990).CrossRefGoogle Scholar
11.Christ, C. L., Am. Mineral. 45, 334 (1960).Google Scholar
12.Christ, C. L. and Clark, J. R., Phys. Chem. Minerals 2, 59 (1977).CrossRefGoogle Scholar
13.Ghose, S., Wan, C., and Clark, J. R., Am. Mineral. 63, 160 (1978).Google Scholar
14.Sueno, S., Takeda, H., and Sadanaga, R., Mineral. J. 6, 172 (1971).CrossRefGoogle Scholar
15.Inoue, Z., Uemura, Y., and Inomata, Y., J. Mater. Sci. 16, 2297 (1981).CrossRefGoogle Scholar
16.Uemura, Y., Inomata, Y., and Inoue, Z., J. Mater. Sci. 16, 2333 (1981).CrossRefGoogle Scholar