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A Kikuchi map for 6H α-SiC

Published online by Cambridge University Press:  29 June 2016

J. E. Lane
Affiliation:
North Carolina State University, Department of Materials Science and Engineering, Box 7907, Raleigh, North Carolina 27695-7907
C. H. Carter
Affiliation:
North Carolina State University, Department of Materials Science and Engineering, Box 7907, Raleigh, North Carolina 27695-7907
K. L. More
Affiliation:
North Carolina State University, Department of Materials Science and Engineering, Box 7907, Raleigh, North Carolina 27695-7907
R. F. Davis
Affiliation:
North Carolina State University, Department of Materials Science and Engineering, Box 7907, Raleigh, North Carolina 27695-7907
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Abstract

A Kikuchimap for the 6H polytype of α-SiC has been constructed for the standard triangle Selected, indexed diffraction spot patterns have also been produced and are included as companion information for the map.

Type
Rapid Communications
Copyright
Copyright © Materials Research Society 1986

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References

1Thomas, G. and Goringe, J. G., Transmission Electron Microscopy of Materials (Wiley, New York, 1979), pp. 112130.Google Scholar
2Edington, J. W., Practical Electron Microscopy in Materials Science, Monograph Two: Electron Diffraction in the Electron Microscope (Philips Gloeilampenfabrieken, Eindhoven, 1975).CrossRefGoogle Scholar
3Loretto, M. H. and Smallman, R. E., Defect Analysis in Electron Microscopy (Wiley, New York, 1975), pp. 117130.Google Scholar
4Thomas, G., Trans. AIME 233, 1608 (1965).Google Scholar
5Levine, E., Bell, W. L., and Thomas, G., J. Appl. Phys. 37, 2141 (1966).CrossRefGoogle Scholar
6Okamoto, P. R., Levine, E., and Thomas, G., J. Appl. Phys. 38, 289 (1967).CrossRefGoogle Scholar
7Jepps, N. W. and Page, T. F., Progress in Crystal Growth and Characterization: Crystal Growth and Characterization of Polytype Structures, edited by Krishna, P. (Pergamon, New York, 1984), Vol. 7, p. 259.Google Scholar
8Ramsdell, R. S., Am. Mineral. 32, 64 (1947).Google Scholar