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Interfaces and defect composition at the near-atomic scale through atom probe tomography investigations

Abstract

Atom probe tomography (APT) is rising in influence across many parts of materials science and engineering thanks to its unique combination of highly sensitive composition measurement and three-dimensional microstructural characterization. In this invited article, we have selected a few recent applications that showcase the unique capacity of APT to measure the local composition at structural defects. Whether we consider dislocations, stacking faults, or grain boundary, the detailed compositional measurements tend to indicate specific partitioning behaviors for the different solutes in both complex engineering and model alloys we investigated.

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a)Address all correspondence to this author. e-mail: b.gault@mpie.de, b.gault@imperial.ac.uk

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b)

Currently also at Department of Materials, Imperial College London, United Kingdom.

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