Hostname: page-component-8448b6f56d-cfpbc Total loading time: 0 Render date: 2024-04-20T01:18:07.369Z Has data issue: false hasContentIssue false
  • English
  • Français

The influence of Pt and SrTiO3 interlayers on the microstructure of PbTiO3 thin films deposited by laser ablation on (001) MgO

Published online by Cambridge University Press:  03 March 2011

S. Stemmer ,
S.K. Streiffer ,
W-Y. Hsu ,
F. Ernst ,
R. Raj  and
M. Rühle
S. Stemmer
Affiliation:
Max-Planck-Institut für Metallforschung, Institut für Werkstoffwissenschaft, Seestraβe 92, 70174 Stuttgart, Germany
S.K. Streiffer
Affiliation:
Max-Planck-Institut für Metallforschung, Institut für Werkstoffwissenschaft, Seestraβe 92, 70174 Stuttgart, Germany
W-Y. Hsu
Affiliation:
Department of Materials Science and Engineering, Bard Hall, Cornell University, Ithaca, New York 14853-1510
F. Ernst
Affiliation:
Max-Planck-Institut für Metallforschung, Institut für Werkstoffwissenschaft, Seestraβe 92, 70174 Stuttgart, Germany
R. Raj
Affiliation:
Department of Materials Science and Engineering, Bard Hall, Cornell University, Ithaca, New York 14853-1510
M. Rühle
Affiliation:
Max-Planck-Institut für Metallforschung, Institut für Werkstoffwissenschaft, Seestraβe 92, 70174 Stuttgart, Germany
Get access

Abstract

We have used conventional and high-resolution transmission electron microscopy to investigate the microstruture of epitaxial, ferroelectric PbTiO3 films grown by pulsed laser ablation on (001) MgO single crystals, and on MgO covered with epitaxial Pt or SrTiO3. Pronounced variations are found in the widths and lengths of a-axis-oriented domains in these films, although the volume fraction of a-axis-oriented material varies only weakly for the different types of samples. In addition, the films deposited onto Pt-coated MgO have a larger grain size than those deposited onto bare MgO or SrTiO3/MgO. Possible reasons for the variations in the distribution of a-axis-oriented material in these samples include differences in the elastic properties and electrical conductivities of the different substrate combinations.

Type
Communication
Information
Journal of Materials Research , Volume 10 , Issue 4 , April 1995 , pp. 791 - 794
Copyright
Copyright © Materials Research Society 1995

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1Ramesh, R., Sands, T., and Keramidas, V. G., Appl. Phys. Lett. 63, 731 (1993).Google Scholar
2Gao, Y., Bai, G., Merkle, K. L., Shi, Y., Chang, H. L. M., Shen, Z., and Lam, D. J., J. Mater. Res. 8, 145 (1993).Google Scholar
3Iijima, K., Tomita, Y., Takayama, R., and Ueda, I., J. Appl. Phys. 60, 361 (1986).Google Scholar
4Matsubara, S., Miura, S., Miyasaka, Y., and Shohata, N., J. Appl. Phys. 66, 5826 (1989).Google Scholar
5Kushida, K. and Takeuchi, H., IEEE Trans. Ultrasonics, Ferroelectrics, and Frequency Control 38, 656 (1991).Google Scholar
6Ghonge, S. G. and Goo, E., Appl. Phys. Lett. 62, 1742 (1993).Google Scholar
7Hsu, W-Y. and Raj, R., Appl. Phys. Lett. 60, 3105 (1992).Google Scholar
8Hsu, W-Y., Ph.D. Dissertation, Cornell University, Ithaca, NY (1994).Google Scholar
9Strecker, A., Salzberger, U., and Maier, J., Prakt. Metallogr. 30, 482 (1993).CrossRefGoogle Scholar
10Gevers, G., Delavignette, P., Blank, H., Landyut, J. V., and Amelinckx, S., Phys. Status Solidi 5, 595 (1964).Google Scholar
11Pompe, W., private communication.Google Scholar
12Arlt, G., J. Mater. Sci. 25, 2655 (1990).Google Scholar
13Roitburd, A. L., Phys. Status Solidi 37, 329 (1976).Google Scholar
14Streiffer, S. K., Zielinski, E. M., Lairson, B. M., and Bravman, J. C., Appl. Phys. Lett. 58, 2171 (1991).Google Scholar
15Kwak, B. S., Erbil, A., Wilkens, B. J., Budai, J. D., Chisholm, M. F., and Boatner, L. A., Phy. Rev. Lett. 68, 3733 (1992).Google Scholar
16Lairson, B. M., Streiffer, S. K., and Bravman, J. C., Phys. Rev. B 42, 10067 (1990).Google Scholar
17Pompe, W., Gong, X., Suo, Z., and Speck, J. S., J. Appl. Phys. 74, 6012 (1993).Google Scholar
18Sviridov, E. V., Alyoshin, V. A., Golovko, Y. I., Zakharchenko, I. N., Mukhortov, V. M., and Dudkevich, V. P., Phys. Status Solidi A 121, 157 (1990).Google Scholar