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The influence of direct current bias on the initial aging of a doped lead magnesium niobate ceramic

Published online by Cambridge University Press:  31 January 2011

Y. Wang
Affiliation:
Department of Materials Science & Engineering, Tsinghua University, Beijing,People's Republic of China and Department of Electronic Engineering, City University of Hong Kong, Hong Kong
Y. C. Chan
Affiliation:
Department of Electronic Engineering, City University of Hong Kong, Hong Kong
Z. L. Gui
Affiliation:
Department of Materials Science & Engineering, Tsinghua University, Beijing,People's Republic of China
L. T. Li
Affiliation:
Department of Materials Science & Engineering, Tsinghua University, Beijing,People's Republic of China
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Abstract

The initial dielectric aging behaviors of a Mg and Mn doped lead magnesium niobate ceramic were investigated over a wide range of direct current (dc) bias. Both the dielectric constant-log(time) and the loss tangent-log(time) were regressed in terms of a linear relationship. The dc bias is found to have a strong influence on the dielectric parameters at the start of aging and to suppress the aging of dielectric constant and loss tangent. The frequency dependence of the dielectric aging is also evidently affected by the dc bias.

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Articles
Copyright
Copyright © Materials Research Society 1998

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References

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