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Ahuja, Rajiv and Fraser, Hamish L. 1994. Microstructural transitions in Titanium-Aluminum thin film multilayers. Journal of Electronic Materials, Vol. 23, Issue. 10, p. 1027.
Lu, Y.C. Dieckmann, R. and Sass, S.L. 1994. Formation of an aluminum peroxide oxide, AlO2, by interfacial reaction between Pt and α-Al2O3. Journal of Physics and Chemistry of Solids, Vol. 55, Issue. 10, p. 1083.
Shechtman, D. van Heerden, D. and Josell, D. 1994. fcc titanium in Ti-Al multilayers. Materials Letters, Vol. 20, Issue. 5-6, p. 329.
Leifer, K. Buffat, P.A. Böni, P. Clemens, D. Friedli, H.P. Grimmer, H. and Anderson, I.S. 1995. Structural and Chemical Characterisation of Ni/Ti Multilayers with TEM. MRS Proceedings, Vol. 382, Issue. ,
Jankowski, A.F. Sandoval, P. and Hayes, J.P. 1995. Superlattice effects on solid-state amorphization. Nanostructured Materials, Vol. 5, Issue. 5, p. 497.
Lu, Y.-C. Agnew, S. Dieckmann, R. and Sass, S.L. 1995. Further characterization of the aluminum peroxide oxide, AlO2, formed by interfacial reaction between Pt and α-Al2O3. Acta Metallurgica et Materialia, Vol. 43, Issue. 5, p. 1885.
Josell, D. Shechtman, D. and van Heerden, D. 1995. fcc titanium in Ti/Ni multilayers. Materials Letters, Vol. 22, Issue. 5-6, p. 275.
Jin, O. and Liu, B.X. 1996. Hexagonal-close-packed face-centered-cubic transformation in irradiated hafnium thin films. Materials Letters, Vol. 27, Issue. 4-5, p. 165.
Banerjee, R. Swaminathan, S. Wheeler, R. and Fraser, H. L. 1996. Structural and Phase Transformations in Thin Film Ti-Aluminides and Ti/Al Multilayers. MRS Proceedings, Vol. 434, Issue. ,
Jankowski, A.R and Wall, M.A. 1996. Synthesis and characterization of nanophase face-centered-cubic titanium. Nanostructured Materials, Vol. 7, Issue. 1-2, p. 89.
Van Heerden, D. Josell, D. and Shechtman, D. 1996. The formation of f.c.c. titanium in titanium-aluminum multilayers. Acta Materialia, Vol. 44, Issue. 1, p. 297.
Vijaya, H. S. Mohan Rao, G. Mohan, S. Muralidhar, G. K. and Subbanna, G. N. 1996. Characterization of titanium thin films prepared by bias assisted magnetron sputtering. Metallurgical and Materials Transactions B, Vol. 27, Issue. 6, p. 1057.
Dregia, S. A. Banerjee, R. and Fraser, H. L. 1997. Structural Stability Diagrams for Thin-Film Multilayers. MRS Proceedings, Vol. 481, Issue. ,
Saleh, Adli A. Shutthanandan, V. Shivaparan, N. R. Smith, R. J. Tran, T. T. and Chambers, S. A. 1997. Epitaxial growth of fcc Ti films on Al(001) surfaces. Physical Review B, Vol. 56, Issue. 15, p. 9841.
Yang, Xiaoyu Cai, Xun and Li, Ying 1998. Microstructure and Micromechanical Properties of SiC-W Multilayer Films. Materials and Manufacturing Processes, Vol. 13, Issue. 6, p. 921.
Tepper, T Shechtman, D van Eleerden, D and Josell, D 1998. Allotropic phase formation in Ti/Zr multilayers. Materials Letters, Vol. 35, Issue. 1-2, p. 100.
Dregia, S.A. Banerjee, R. and Fraser, H.L. 1998. Polymorphic phase stability in thin multilayers. Scripta Materialia, Vol. 39, Issue. 2, p. 217.
Vieira, M.T and Ramos, A.S 1999. The influence of ductile interlayers on the mechanical performance of tungsten nitride coatings. Journal of Materials Processing Technology, Vol. 92-93, Issue. , p. 156.
Jankowski, Alan F 2000. Superlattice effects on the amorphization of Ni–Ti multilayers. Thin Solid Films, Vol. 377-378, Issue. , p. 646.
Lai, Wen Sheng Zhang, Qing Liu, Bai Xin and Ma, Evan 2000. Structural Stability and Amorphization Transition in the Ni–Ti System Studied by Molecular Dynamics Simulation with an n-Body Potential. Journal of the Physical Society of Japan, Vol. 69, Issue. 9, p. 2923.
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The artificial layering of metals can change both physical and structural characteristics from the bulk. The stabilization of polymorphic metallic phases can occur on a dimensional scale that ranges from single overgrowth layers to repetitive layering at the nanoscale. The sputter deposition of crystalline titanium on nickel, as both a single layer and in multilayer form, has produced a face-centered cubic phase of titanium. The atomic structure of the face-centered cubic titanium phase is examined using high resolution electron microscopy in combination with electron and x-ray diffraction.
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