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Direct observation of ordering in (GaIn) P

Published online by Cambridge University Press:  31 January 2011

S. McKernan
Affiliation:
Department of Materials Science and Engineering. Bard Hall. Cornell University, Ithaca, New York 14853
B. C. De Cooman
Affiliation:
Department of Materials Science and Engineering. Bard Hall. Cornell University, Ithaca, New York 14853
C. B. Carter
Affiliation:
Department of Materials Science and Engineering. Bard Hall. Cornell University, Ithaca, New York 14853
D. P. Bour
Affiliation:
School of Electrical Engineering, Phillips Hall, Cornell University, Ithaca, New York 14853
J. R. Shealy
Affiliation:
School of Electrical Engineering, Phillips Hall, Cornell University, Ithaca, New York 14853
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Abstract

Gax In1 − x Pepilayers grown under a range of growth conditions by organometallic vapor phase epitaxy (OMVPE) on GaAs substrates have been studied in the electron microscope. The results show the presence of an ordering of the group III sublattice parallel to some of the {111} planes. Dark-field images directly reveal ordered domains of different orientations that appear not to be perfect, but contain many planar defects parallel to the growth surface.

Type
Rapid Communications
Copyright
Copyright © Materials Research Society 1988

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References

REFERENCES

1Srivastava, G. P., Martins, J. L., and Zunger, A., Phys. Rev. B 31, 2561 (1985).CrossRefGoogle Scholar
2Martins, J. L. and Zunger, A., J. Mater. Res. 1, 523 (1986).CrossRefGoogle Scholar
3Kuan, T. S., Keuch, T. F., Wang, W. I., and Wilkie, E. L., Phys. Rev. Lett. 54, 201 (1985).CrossRefGoogle Scholar
4Jen, H. R., Cherng, M. J., and Stringfellow, G. B., Appl. Phys. Lett. 48, 1603 (1986).CrossRefGoogle Scholar
5Shahid, M. A., Mahajan, S., Laughlin, D. E., and Cox, H. M., Phys. Rev. Lett. 58, 2567 (1987).CrossRefGoogle Scholar
6Gomyo, A., Suzuki, T., Kobayashi, K., Kawata, S., Hino, I., and Yuasa, T., Appl. Phys. Lett. 50, 637 (1987).CrossRefGoogle Scholar
7Ourmazd, A. and Bean, J. C., Phys. Rev. Lett. 55, 765 (1985).CrossRefGoogle Scholar