Hostname: page-component-8448b6f56d-cfpbc Total loading time: 0 Render date: 2024-04-23T11:37:54.516Z Has data issue: false hasContentIssue false
  • English
  • Français

Development of laboratory x-ray fluorescence holography equipment

Published online by Cambridge University Press:  31 January 2011

Yukio Takahashi ,
Kouichi Hayashi ,
Kimio Wakoh ,
Naomi Nishiki  and
Eiichiro Matsubara
Yukio Takahashi
Affiliation:
Graduate School, Department of Materials Science, Tohoku University, Sendai 980–8579, Japan
Kouichi Hayashi
Affiliation:
Institute for Materials Research, Tohoku University, Sendai 980–8577, Japan
Kimio Wakoh
Affiliation:
Institute for Materials Research, Tohoku University, Sendai 980–8577, Japan
Naomi Nishiki
Affiliation:
Production Engineering Laboratory, Matsushita Electric Industrial Company, Ltd., Kadoma 571–8501, Japan
Eiichiro Matsubara
Affiliation:
Institute for Materials Research, Tohoku University, Sendai 980–8577, Japan
Get access

Abstract

Laboratory x-ray fluorescence holography equipment was developed. A single-bent graphite monochromator with a large curvature and a high-count-rate x-ray detection system were applied in this equipment. To evaluate the performance of this equipment, a hologram pattern of a gold single crystal was measured. It took two days, which was about one-third the time required for the previous measurements using the conventional x-ray source and several times that using the synchrotron source. The quality of the hologram pattern is as good as that obtained using the synchrotrons. Clear atomic images on (002) are reconstructed.

Type
Articles
Information
Journal of Materials Research , Volume 18 , Issue 6 , June 2003 , pp. 1471 - 1473
Copyright
Copyright © Materials Research Society 2003

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

REFERENCES

1.Gabor, D., Nature 777, 161 (1948).Google Scholar
2.Szöke, A., in Short Wavelength Coherent Radiation: Generation and Application, edited by Attwood, D.T., Boker, J. (AIP Conference Proceedings 147, American Institute of Physics, New York, 1986), pp. 361.Google Scholar
3.Harp, G.R., Saldin, D.K., and Tonner, B.P., Phys. Rev. Lett. 65, 1012 (1990).CrossRefGoogle Scholar
4.Tegze, M. and Faigel, G., Nature (London) 380, 49 (1996).CrossRefGoogle Scholar
5.Gog, T., Eisenhower, R.A., Menk, R.H., Tegze, M., LeDuc, G., J. Electron Spectrosc. Relat. Phenom. 92, 123 (1998).CrossRefGoogle Scholar
6.Tegze, M., Faigel, G., Marchesini, S., Belakhovsky, M., and Chumakov, A.I., Phys. Rev. Lett. 82, 4847 (1999).CrossRefGoogle Scholar
7.Tegze, M., Faigel, G., Marchesini, S., Belakhovsky, M., and Ulrich, O., Nature 407, 38 (2000).CrossRefGoogle Scholar
8.Hayashi, K., Matsui, M., Awakura, Y., Kaneyoshi, T., Tanida, H., and Ishii, M., Phys. Rev. B 63, R41201-1 (2001).CrossRefGoogle Scholar
9.Marchesini, S., Schmithüsen, F., Tegze, M., Faigel, G., Calvayrac, Y., Belakhovsky, M., Chevrier, J., and Simionovici, A.S., Phys. Rev. Lett. 85, 4723 (2000).CrossRefGoogle Scholar
10.Nishiki, N., Kawashima, T., Naka, H., Makino, M., and Matsubara, E., Materia Japan 38, 43 (1999).CrossRefGoogle Scholar
11.Omori, S., Kawai, J., and Nihei, Y., J. Phy. Soc. J. 69, 1263 (2000).CrossRefGoogle Scholar
12.Kishimoto, S., Rev. Sci. Instrum. 63, 824 (1992).CrossRefGoogle Scholar
13.Hayashi, K., Takahashi, Y., and Matsubara, E., Materia Japan 40, 801 (2001).CrossRefGoogle Scholar
14.Barton, J.J., Phy. Rev. Lett. 67, 3106 (1991).CrossRefGoogle Scholar