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Chemical analyses of stains formed on Co–Nb–Zr metal-in-gap heads sliding against oxide and metal particle magnetic tapes

Published online by Cambridge University Press:  03 March 2011

B.K. Gupta ,
Bharat Bhushan ,
Ying Zhou ,
N. Winograd  and
K. Krishnan
B.K. Gupta
Affiliation:
Computer Microtribology and Contamination Laboratory, Department of Mechanical Engineering. The Ohio State University, Columbus, Ohio 43210-1107
Bharat Bhushan
Affiliation:
Computer Microtribology and Contamination Laboratory, Department of Mechanical Engineering. The Ohio State University, Columbus, Ohio 43210-1107
Ying Zhou
Affiliation:
Department of Chemistry, The Pennsylvania State University. 152 Davey Laboratory. University Park, Pennsylvania 16820
N. Winograd
Affiliation:
Department of Chemistry, The Pennsylvania State University. 152 Davey Laboratory. University Park, Pennsylvania 16820
K. Krishnan
Affiliation:
Bio-Rad, Digilab Division, 237 Putnam Avenue, Cambridge, Massachusetts 02139
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Abstract

The playback efficiency of metal-in-gap (MIG) inductive read-write heads in magnetic recording devices is strongly influenced by wear of the air-bearing surface, metal core recession, and staining. In this study, stains were formed by sliding Co–Nb–Zr MIG tape heads against Co–γFe2O3 (oxide) and metal particle (MP) tapes in an accelerated mode. Optical and SEM imaging indicated that staining on a head run against the Co–γFe2O3 tape is thick and patchy, whereas on a head run against the MP tape, staining is in the form of a uniform film. Thickness variations of stains on the metal core formed by Co-γFe2O3 and MP tapes, measured using atomic force microscopy (AFM), were about 30–150 nm and 20 nm, respectively. Constituents of stains were analyzed by time-of-flight secondary ion mass spectrometry (TOF-SIMS), scanning Auger electron spectroscopy (AES), and micro-Fourier transform infrared (micro-FTIR) and micro-Raman spectroscopies. Stains formed on the head run against the Co-γFe2O3 tape consist of organic species with trace amounts of iron and oxygen (inorganic) constituents. On the other hand, stains formed on the head run against the MP tape consist of inorganic constituents of oxidized magnetic particles from the tape. In addition to organic species and iron from tapes, stains formed by either tape also exhibit wear debris from the metal core, ferrite core, and glass region of the head itself. In the case of heads run against both tapes, most of the staining was found to be on the metal core.

Type
Articles
Information
Journal of Materials Research , Volume 10 , Issue 7 , July 1995 , pp. 1795 - 1810
Copyright
Copyright © Materials Research Society 1995

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References

REFERENCES

1Bhushan, B., Tribology and Mechanics of Magnetic Storage Devices (Springer-Verlag, New York, 1990).CrossRefGoogle Scholar
2Bhushan, B. and Hahn, F. W. Jr., Wear (1995, in press).Google Scholar
3Kelly, J., in Magnetic Tape Recording for the Eighties, edited by Kalil, F. (NASA Reference Publication No. 1075, NASA, Washington, DC 1982), pp. 7–22.Google Scholar
4Lemke, J. U., Annals New York Academy of Sciences: The Advances in Magnetic Recording 189, 171–190 (1972).Google Scholar
5Lauer, J. L. and Blanc, P. M., Polymer Preprints, Division of Polymer Chem. 29(2), 275–276 (1988).Google Scholar
6Narishige, S. and Sato, M., J. Jpn. Inst. Metals (Japanese) 43, 1168–1174 (1979).CrossRefGoogle Scholar
7Arudi, R. L. and McCracken, J. A., Minutes of THIC Meeting, October 3 (1989).Google Scholar
8Ota, H., Namura, K., and Ohmae, N., Adv. Info. Storage Syst. 2, 85–96 (1991).Google Scholar
9Reichlmaier, S., The PHI Interface (Perkin-Elmer Corporation, Eden Prairie, MN, 1992), Vol. 14, No. 2, pp. 1–4.Google Scholar
10Stahle, CM. and Lee, T.D., Adv. Info. Storage Syst. 4, 75–86 (1992).Google Scholar
11Tsuchiya, T. and Bhushan, B., Trib. Trans. (1995, in press).Google Scholar
12Strossman, G., Charles Evans & Associates, 301 Chesapeake Drive, Redwood City, CA 94063, personal communications.Google Scholar
13CD. Wagner, Riggs, W. M., Davis, L. E., Moulder, J. F., and Muilenberg, G.E., Handbook of Photoelectron Spectroscopy (Perkin-Elmer Corporation, Eden Prairie, MN, 1979).Google Scholar
14Wong, J. S. and Yen, Y-S., Appl. Spectrosc. 42, 598–604 (1988).CrossRefGoogle Scholar
15Liew, Y-F., Lauer, J. L., Talke, F. E., and Cornell, K., in Tribology and Mechanics of Magnetic Storage Systems (STLE, Park Ridge, IL, 1994), Vol. 9, pp. 53–57.Google Scholar