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Characterization of metallurgical grade silicon

Published online by Cambridge University Press:  31 January 2011

J. C. Anglézio ,
C. Servant  and
F. Dubrous
J. C. Anglézio
Affiliation:
Laboratoire de Métallurgie Structurale, U.A. CNRS 1107, UPS 91405, OrsayCedex, France
C. Servant
Affiliation:
Laboratoire de Métallurgie Structurale, U.A. CNRS 1107, UPS 91405, OrsayCedex, France
F. Dubrous
Affiliation:
Laboratoire d'Electrothermie de Chedde, Péchiney Electrométallurgie, 74190 Le Fayet, France
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Abstract

Optical metallography, scanning electron microscopy, electron microprobe analysis, and transmission electron microscopy were used to characterize metallurgical grade silicon, produced in an electric are furnace. Coincidence fraction determinations were assumed to be Σ7 and Σ9 when grain boundaries are underlined by precipitated phases and Σ3 when they are not. The study of intergranular compounds was emphasized; ten compounds were found, the main ones being Si2Ca, Si8Al6Fe4Ca, Si2Al2Ca, Si2FeTi, and Si2.4Fe (α leboitc). The precipitation of these compounds was discussed according to the principal impurity concentrations in silicon. The crystalline structure of Si8Al6Fe4Ca was determined to be triclinic with a = 1.3923 nm, b = 1.3896 nm, c = 1.3900 nm and α = 92.4°, β = 110.3°, γ = 119.9°.

Type
Articles
Information
Journal of Materials Research , Volume 5 , Issue 9 , September 1990 , pp. 1894 - 1899
Copyright
Copyright © Materials Research Society 1990

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