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An overview of interface-dominated deformation mechanisms in metallic nanocomposites elucidated using in situ straining in a TEM

Published online by Cambridge University Press:  07 March 2019

Yuchi Cui*
Affiliation:
Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109, USA
Nan Li
Affiliation:
Center for Integrated Nanotechnologies, Los Alamos National Laboratory, Los Alamos, New Mexico 87545, USA
Amit Misra
Affiliation:
Department of Materials Science and Engineering, University of Michigan, Ann Arbor, Michigan 48109, USA; and Department of Mechanical Engineering, University of Michigan, Ann Arbor, Michigan 48109, USA
*
a)Address all correspondence to this author. e-mail: tedcui@umich.edu
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Abstract

Nanostructured multiphase metallic materials present extraordinary properties, such as high strength, enhanced fatigue and radiation resistance, and thermal stability, compared to conventional bulk metallic materials. Previous research studies have shown that their deformation and fracture behavior are dominated by defect interactions at internal interfaces. In situ straining, including nanoindentation, compression, and tension, in a transmission electron microscope (TEM) has emerged as a powerful tool to investigate the physics of defect–interface interactions at the nano-scale and even atomic scale. The mechanistic insights gained from these experiments coupled with dislocation theory and atomistic modeling has helped develop a fundamental understanding of the mechanical properties. In this article, through some recent investigations on observing dislocation and interface activities, crack propagation, and nanopillar compression, we present current progress in utilizing in situ TEM straining to examine interface-dominated deformation mechanisms.

Type
Invited Feature Paper - REVIEW
Copyright
Copyright © Materials Research Society 2019 

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Footnotes

b)

This author was an editor of this journal during the review and decision stage. For the JMR policy on review and publication of manuscripts authored by editors, please refer to http://www.mrs.org/editor-manuscripts/.

This paper has been selected as an Invited Feature Paper.

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