Skip to main content Accessibility help

We use cookies to distinguish you from other users and to provide you with a better experience on our websites. Close this message to accept cookies or find out how to manage your cookie settings.

Close cookie message
×
Home
  • Home
Hostname: page-component-78dcdb465f-hcvhd Total loading time: 17.846 Render date: 2021-04-15T09:07:00.145Z Has data issue: true Feature Flags: { "shouldUseShareProductTool": true, "shouldUseHypothesis": true, "isUnsiloEnabled": true, "metricsAbstractViews": false, "figures": false, "newCiteModal": false, "newCitedByModal": true }
EnglishFrançais
Journal of Materials Research Journal of Materials Research

Article contents

Influence of deposition rate on the properties of thick YBa2Cu3O7–δ films

Published online by Cambridge University Press:  31 January 2011

S. R. Foltyn ,
E. J. Peterson ,
J. Y. Coulter ,
P. N. Arendt ,
Q. X. Jia ,
P. C. Dowden ,
M. P. Maley ,
X. D. Wu  and
D. E. Peterson
S. R. Foltyn
Affiliation:
Superconductivity Technology Center, Los Alamos National Laboratory, Los Alamos, New Mexico 87545
E. J. Peterson
Affiliation:
Superconductivity Technology Center, Los Alamos National Laboratory, Los Alamos, New Mexico 87545
J. Y. Coulter
Affiliation:
Superconductivity Technology Center, Los Alamos National Laboratory, Los Alamos, New Mexico 87545
P. N. Arendt
Affiliation:
Superconductivity Technology Center, Los Alamos National Laboratory, Los Alamos, New Mexico 87545
Q. X. Jia
Affiliation:
Superconductivity Technology Center, Los Alamos National Laboratory, Los Alamos, New Mexico 87545
P. C. Dowden
Affiliation:
Superconductivity Technology Center, Los Alamos National Laboratory, Los Alamos, New Mexico 87545
M. P. Maley
Affiliation:
Superconductivity Technology Center, Los Alamos National Laboratory, Los Alamos, New Mexico 87545
X. D. Wu
Affiliation:
Superconductivity Technology Center, Los Alamos National Laboratory, Los Alamos, New Mexico 87545
D. E. Peterson
Affiliation:
Superconductivity Technology Center, Los Alamos National Laboratory, Los Alamos, New Mexico 87545
Get access

Abstract

To investigate potential limits to the rate at which high-quality YBa2Cu3O7–δ can be deposited, we have produced a series of 1 μm thick films by pulsed laser deposition on single-crystal SrTiO3 substrates at average rates ranging from 2 Å/s to 240 Å/s. The critical current density of low-rate films was over 2 MA/cm2 at 75 K, self field, but dropped linearly with rate to about 1 MA/cm2 at the upper end of the range. In addition, the superconducting transition temperature, resistivity above the transition, and performance in an applied magnetic field were all degraded by increasing the deposition rate. A change in c-axis lattice parameter suggests that possible causes for this degradation are oxygen deficiency or cation disorder with the latter being the more likely. Annealing high-rate films at 790 °C for as little as 20 min improved critical current density to within 20% of low-rate values, and resulted in dramatic improvements in other film properties as well.

Type
Articles
Information
Journal of Materials Research , Volume 12 , Issue 11 , November 1997 , pp. 2941 - 2946
Copyright
Copyright © Materials Research Society 1997

Access options

Get access to the full version of this content by using one of the access options below.
If you should have access and can't see this content please contact technical support.

References

1.Iijima, Y., Tanabe, N., Kohno, O., and Ikeno, Y., Appl. Phys. Lett. 60, 769 (1992); Y. Iijima, K. Onabe, N. Futaki, N. Tanabe, N. Sadakara, O. Kohno, and Y. Ikeno, J. Appl. Phys. 74, 1905 (1993).CrossRefGoogle Scholar
2.Wu, X. D., Foltyn, S.R., Arendt, P. N., Townsend, J., Adams, C., Campbell, I. H., Tiwari, P., Coulter, J. Y., and Peterson, D. E., Appl. Phys. Lett. 65, 1961 (1994); X. D. Wu, S.R. Foltyn, P. N. Arendt, W. R. Blumenthal, I. H. Campbell, J. D. Cotton, J. Y. Coulter, W. L. Hults, M. P. Maley, H. F. Safar, and J. L. Smith, Appl. Phys. Lett. 67, 2397 (1995).CrossRefGoogle Scholar
3.Goyal, A., Norton, D. P., Budai, J. D., Paranthaman, M., Specht, E. D., Kroeger, D. M., Christen, D. K., He, Q., Saffian, B., List, F. A., Lee, D. F., Martin, P. M., Klabunde, , Hartfield, E., and Sikka, V. K., Appl. Phys. Lett. 69, 1795 (1996).CrossRefGoogle Scholar
4.Hammond, R. H., Proc. 8th Int. Symp. on Superconductivity (ISS'95), Oct. 30–Nov. 2, 1995, Hamamatsu, Japan.Google Scholar
5.Wu, X. D., Muenchausen, R. E., Foltyn, S. R., Estler, R. C., Dye, R. C., Nogar, N. S., Garcia, A. R., Martin, J., and Tesmer, J., Appl. Phys. Lett. 56, 1481 (1990); X. D. Wu, R. E. Muenchausen, S. R. Foltyn, R. C. Estler, R. C. Dye, A. R. Garcia, N. S. Nogar, P. England, R. Ramesh, D. M. Hwang, T. S. Ravi, C. C. Chang, T. Venkatesan, X. X. Xi, Q. Li, and A. Inam, Appl. Phys. Lett. 57, 523 (1990); X. D. Wu, R. E. Muenchausen, S. R. Foltyn, R. C. Estler, N. S. Nogar, A. D. Rollett, C. C. Chang, P. England, R. Ramesh, D. M. Hwang, and T. S. Ravi, IEEE Trans. Magn. 27, 1445 (1991).CrossRefGoogle Scholar
6.Hubler, G. K., in Pulsed Laser Deposition of Thin Films, edited by Chrisey, D. B. and Hubler, G. K. (John Wiley and Sons, Inc., New York, 1994), Chap. 13.Google Scholar
7.Foltyn, S. R., Tiwari, P., Dye, R. C., Le, M. Q., and Wu, X. D., Appl. Phys. Lett. 63, 1848 (1993).CrossRefGoogle Scholar
8.Chang, C. C., Wu, X. D., Ramesh, R., Ravi, T. S., Venkatesan, T., Hwang, D. M., Muenchausen, R. E., Foltyn, S. R., and Nogar, N. S., Appl. Phys. Lett. 57, 1814 (1990).CrossRefGoogle Scholar
9.Andersen, N. H., Lebech, B., and Poulsen, H. F., Physica C 172, 31 (1990).CrossRefGoogle Scholar
10.Jorgensen, J. D., Veal, B. W., Paulikas, A. P., Nowicki, L. J., Crabtree, G. W., Claus, H., and Kwok, W. K., Phys. Rev. B 41, 1863 (1990).CrossRefGoogle Scholar
11.Ye, J. and Nakamura, K., Phys. Rev. B 48, 7554 (1993).CrossRefGoogle Scholar
12.Schulz, R., Simoneau, M., and Lanteigne, J., Physica C 233, 113 (1994).CrossRefGoogle Scholar
13.Roas, B., Schultz, L., and Saemann-Ischenko, G., Phys. Rev. Lett. 64, 479 (1990).CrossRefGoogle Scholar

Full text views

Full text views reflects PDF downloads, PDFs sent to Google Drive, Dropbox and Kindle and HTML full text views.

Total number of HTML views: 0
Total number of PDF views: 32 *
View data table for this chart

* Views captured on Cambridge Core between September 2016 - 15th April 2021. This data will be updated every 24 hours.

Send article to Kindle

To send this article to your Kindle, first ensure no-reply@cambridge.org is added to your Approved Personal Document E-mail List under your Personal Document Settings on the Manage Your Content and Devices page of your Amazon account. Then enter the ‘name’ part of your Kindle email address below. Find out more about sending to your Kindle. Find out more about sending to your Kindle.

Note you can select to send to either the @free.kindle.com or @kindle.com variations. ‘@free.kindle.com’ emails are free but can only be sent to your device when it is connected to wi-fi. ‘@kindle.com’ emails can be delivered even when you are not connected to wi-fi, but note that service fees apply.

Find out more about the Kindle Personal Document Service.

Influence of deposition rate on the properties of thick YBa2Cu3O7–δ films
Available formats
×

Send article to Dropbox

To send this article to your Dropbox account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Dropbox.

Influence of deposition rate on the properties of thick YBa2Cu3O7–δ films
Available formats
×

Send article to Google Drive

To send this article to your Google Drive account, please select one or more formats and confirm that you agree to abide by our usage policies. If this is the first time you use this feature, you will be asked to authorise Cambridge Core to connect with your <service> account. Find out more about sending content to Google Drive.

Influence of deposition rate on the properties of thick YBa2Cu3O7–δ films
Available formats
×
×

Reply to: Submit a response

Your details

Conflicting interests

Do you have any conflicting interests? *