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A Technique for Producing Strain-Free Flat Surfaces on Single Crystals of Ice

  • T. M Tobin (a1) and K. Itagaki (a1)

Abstract

The top surface of an accurately aligned ice crystal is melted by an aluminum surface and then frozen to a warm “Lucite” plate ant! tapped free. Etch-pit development shows that the dislocation density on the resulting surface is similar to die bulk dislocation density determined by X-ray topographic methods.

La surface supérieure d'un cristal de glace soigneusement aplanie est fondue par une surface d'aluminium puis fixée par regel à une assiette chauffable “Lucite” et libérée par tapotements. Le développement superficiel de figures gravées montre que la fréquence des dislocations du réseau cristallin sur la surface résultant de ce traitement est semblable à la fréquence des dislocations dans la masse que l'on peut déterminer par une etude tie localisation aux rayons X.

Zusammenfassung

Die Deckfläche eines genau ausgerichteten Eiskristalls wird mit einer Aluminiumfläche angeschmolzen, dann auf eine warme “Lucite”-Platte aufgefroren und freigeklopft. Die Entwicklung von Ätz-Löchern zeigt, dass die Dichte der Versetzungen auf der entstandenen Oberfläche ähnlich der Gesamtdichte ist, die sich mit Röntgentopographie bestimmen lässt.

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Copyright

References

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Barakat, N. 1961 Interferometric microscopical studies and measurements of growth features on crystal surfaces. Zeiss–Mitteilungen, Bd 2, p. 23539.
Feuersanger, A.E. 1963 Interference microscopy of thin films: and semiconductor structures, Solid State Design, Vol. 4, No. 10, p. 2932.
Ingelstam, E. 1960 Problems related to the accurate interpretation of microinterferograms. (In Interferometry: a symposium held at the National Physical Laboratory on 9th, 10th June 1959 London, H.M.S.O., p. 13763.)
Itagaki, K. 1967 Some surface phenomena of ice. Journal of Colloid and Interface Science, Vol. 25, No. 2, p. 21827.
Maiya, P.S. Blakely, J.M. 1965 A technique for study of mass transport mechanisms at crystal surfaces. Applied Physics Letters, Vol. 7, No. 3, p. 6062.
Torge, K. 1966 The interference microscope, Zeiss Information, Vol. 15, No. 61, p. 10003.

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