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Failure distributions of shock models

  • Gary Gottlieb (a1)


A single device shock model is studied. The device is subject to some damage process. Under the assumption that as the cumulative damage increases, the probability that any additional damage will cause failure increases, we find sufficient conditions on the shocking process so that the life distribution will be increasing failure rate.


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Postal address: Graduate School of Business Administration, New York University, 100 Trinity Place, New York, NY 10006, U.S.A.


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Failure distributions of shock models

  • Gary Gottlieb (a1)


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