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Automated bench test for UHF RFID tags measurement in operational environment

  • Audrey Pouzin (a1) (a2), Tan-Phu Vuong (a3), Smaïl Tedjini (a1) and Jacques Perdereau (a2)

Abstract

This paper synthesizes protocol measurements for Ultra High Frequency (UHF) radiofrequency identification (RFID) tags’ performance. We introduce the main parameters allowing the evaluation of an inlay tag performances. We characterize all devices implemented on the test bench. We explain the different programs and all methods used for the software automation. Finally, we studied the variation of the measured parameters as a function of power, frequency, or tag orientation, both in free space and in disturbed environment through our automated test bench

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Corresponding author

Corresponding author: A. Pouzin Email: Audrey.pouzin@9online.fr

References

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[1]Dobkin, D.M.: The RF in RFID: Passive UHF RFID in Practice, ed. Newnes, 2007, ISBN 0750682094, 9780750682091.
[2]Penttilä, K. et al. : Radar cross-section analysis for passive RFID systems. IEE Proc., Microw. Antennas Propag., 153 (1) (2006), 103109.
[3]Nikitin, P.V.; Rao, K.V.S.: Theory and measurement of backscattering from RFID tags. IEEE Antennas Propag. Mag., 48 (6) (2006), 212218.
[4]Pouzin, A.; Vuong, T.P.; Tedjini, S.; Perdereau, J.; Dreux, L.: Measurement of radar cross section for passive UHF RFID tags, in Proc. of the Second European Conf. on Antennas and Propagation EuCAP, 2007.
[5]Nikitin, P.V.; Rao, K.V.S.: LabVIEW-based UHF RFID tag test and measurement system. IEEE Trans. Ind. Electron., 56 (7) (2009), 23742381.
[6]Nikitin, P.V.; Rao, K.V.S.; Martinez, R.D.: Differential RCS of RFID tag. Electron. Lett., 43 (8) (2007), 431432.
[7]Pouzin, A.; Vuong, T.P.; Tedjini, S.; Pouyet, M.; Perdereau, J.; Dreux, L.: Determination of measurement uncertainties applied to the RCS and the differential RCS of UHF passive RFID tags, in Proc. of the IEEE Int. Symp. on Antennas & Propagation, 2009.

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Automated bench test for UHF RFID tags measurement in operational environment

  • Audrey Pouzin (a1) (a2), Tan-Phu Vuong (a3), Smaïl Tedjini (a1) and Jacques Perdereau (a2)

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