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The design of a double ended interferometer (DEI)

Published online by Cambridge University Press:  02 December 2014

O. Kruger*
Affiliation:
NMISA, Private Bag X34, Lynwood Ridge 0040, Pretoria, South Africa
F. Hungwe
Affiliation:
NMISA, Private Bag X34, Lynwood Ridge 0040, Pretoria, South Africa
N. Farid
Affiliation:
NIS, Tersa st., Haram, Giza code 12211, P.O.136, Giza, Egypt
K. Schreve
Affiliation:
SUN, Private Bag X1 Matieland 7602, South Africa
*
Correspondence: oakruger@nmisa.org
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Abstract

At NMISA the SI unit for length is realised by an iodine stabilised He-Ne laser, an optical measurement. In industry most measurements are performed by mechanical probing. Gauge blocks are the link between the optical measurements and the mechanical measurements, and are therefore critical in disseminating traceability. The gauge block length is currently determined by wringing the gauge block onto a platen. This is laborious, requires skill and causes contact errors. Since around 1943, there have been efforts to build a double ended interferometer where gauge block length can be determined without wringing it onto a platen. While there has been a lot of progress in building DEIs, to date, there is still no commercially available DEI. We present a collaboration project between the National Metrology Institute of South Africa (NMISA), the National Institute of Standards (NIS Egypt) and Stellenbosch University (SUN) in South Africa to build a double ended interferometer for use at the respective National Metrology Institutes. We investigate improvements to the interferometric calibration of gauge blocks and recent developments. The different systems currently in use in the national metrology laboratories are described and various designs are investigated. Lastly the expected outcome of the project will be discussed.

Type
Research Article
Copyright
© EDP Sciences 2014

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References

Ishii, Y., New method for interometric measurement of gauge blocks without wringing onto a platen. Metrologia 35, 67 (1998) CrossRefGoogle Scholar
Abdelaty, A., Walkov, A., Franke, P., Schödel, R., Challenges on double ended gauge block interferometry unveiled by the study of a prototype at PTB, Metrologia 49, (2012) CrossRefGoogle Scholar
Siddal, G.J., Willey, P.C.T., Flat surface wringing and contact error variability, J. Phys. D 3, 8 (1970) CrossRefGoogle Scholar
Thwaite, E.G., Phase correction in the interferometric measurement of end standards, Metrologia 14, 5362 (1978) CrossRefGoogle Scholar
K.V. Rajesh, A study of gage block wringing. Center for precision metrology, university of north Carolina at Charlotta, 2005. http://www.aspe.net/publications/Annual˙2005/POSTERS/3METRO/6SURF/1831.PDF
J.E. Dekker, P. Franke, G. Boensch, On the influence of gauge blocks roughness, Proc. SPIE 5879, 587907, 2005
Titov, A., Malinovsky, I., Massone, A., Gauge block measurements with nanometre uncertainty, Metrologia 37, 121 (2000) CrossRefGoogle Scholar
Titov, A., Malinovsky, I., Massone, A., Realizing subnanometer accuracy level in gauge block measurements, Proc. SPIE 3477 (1998) CrossRefGoogle Scholar
Bonsch, Concerning two recent papers on gauge block measurement by interferometry, Metrologia 39, 101 (2002) CrossRef
Bonsch, Interferometric calibration of an integrating sphere for the determination of the roughness correction of gauge blocks, Proc. SPIE 3477, 152 (1998) CrossRef
Tesa gauge block interferometer manual
Cramer, O.W., Thompson, G., Turner, R., An instrument for measuring end bars, S. Afr. J. Phys. 10, 1 (1987) Google Scholar
O. Kruger, T&M conference, 2009
Buchta, Z., Řeřucha, S., Mikel, B., Čížek, M., Lazar, J., Číp, O., Novel principle of contactless gauge block calibrations, Sensors 3, 33503358 (2012) CrossRefGoogle Scholar