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Surface characterization of ICF capsule by AFM-based profilometer

  • Jie Meng (a1), Xuesen Zhao (a2), Xing Tang (a1), Yihao Xia (a1), Xiaojun Ma (a1) and Dangzhong Gao (a1)...

Abstract

Outside surface fluctuations of inertial confinement fusion (ICF) capsule greatly affect the implosion performance. An atomic force microscope (AFM)-based profilometer is developed to precisely characterize the capsule surface with nanometer resolution. With the standard nine surface profiles and the complete coverage data, 1D and 2D power spectra are obtained to quantitatively qualify the capsule. Capsule center fast aligning, orbit traces automatic recording, 3D capsule orientation have been studied to improve the accuracy and efficiency of the profilometer.

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Copyright

This is an Open Access article, distributed under the terms of the Creative Commons Attribution licence (http://creativecommons.org/licenses/by/4.0/), which permits unrestricted re-use, distribution, and reproduction in any medium, provided the original work is properly cited.

Corresponding author

Correspondence to: D. Gao, Research Center of Laser Fusion, CAEP, No. 64 Mianshan Road, Mianyang 621000, China. Email: dgaocn@163.com

References

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Keywords

Surface characterization of ICF capsule by AFM-based profilometer

  • Jie Meng (a1), Xuesen Zhao (a2), Xing Tang (a1), Yihao Xia (a1), Xiaojun Ma (a1) and Dangzhong Gao (a1)...

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