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Prototype testing of a composite-type active grating bender with Si substrate for surface profile high-order term elimination

Published online by Cambridge University Press:  17 May 2011

T.-C. Tseng
Affiliation:
National Synchrotron Radiation Research Center, Taiwan
S.-Y. Perng
Affiliation:
National Synchrotron Radiation Research Center, Taiwan
H.-S. Fung
Affiliation:
National Synchrotron Radiation Research Center, Taiwan
S.-W. Lin
Affiliation:
National Synchrotron Radiation Research Center, Taiwan
J.-C. Syu
Affiliation:
National Synchrotron Radiation Research Center, Taiwan
K.-H. Hsu
Affiliation:
National Synchrotron Radiation Research Center, Taiwan
C.-T. Chen
Affiliation:
National Synchrotron Radiation Research Center, Taiwan
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Abstract

The previous monolithic active grating bender design met some basic design requirements. However, after a real grating (BM-AGM) had been fabricated and installed for testing, the results showed that the usable length is a mere 60 mm because of the higher-order term error in the surface profile. A method was thus derived to eliminate the higher-order term error by modifying the width of the bender substrate through finite-element method simulation, reducing the residual error from about 100 nm to 6 nm. Owing to the closure of the grating department of Zeiss, ruling the monolithic bender is no longer available and the design has to be modified to a composite-type bender with Si substrate. A prototype was fabricated and assembled to examine all the design situations. The surface roughness of the width-modified Si substrate is around 30 nm before assembly. The residual error after assembly and bending is less than 10 nm. It proves that the design is feasible. However, due to the manufacturing capacity of the vendor, a short-length substrate is required and the design has to be modified. The detailed design modification and testing results are presented in this paper.

Type
Poster paper
Copyright
Copyright © Diamond Light Source Ltd 2011

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References

Huang, S., Huang, D., Huang, H., Fung, H., Ful, H. & Chen, C. 2009 Resonant Inelastic Soft X-Ray Scattering of Strongly Correlated Compounds with AGM-AGS, SRI. http://www.nsrrc.org.tw/BT_REPORT/%E6%9B%BE%E6%BE%A4%E5%B7%9D-200090925-2.pdf.Google Scholar
Fung, H.S., Chen, C. T., Huang, L. J., Chang, C. H., Chung, S. C., Wang, D. J., Tseng, T. C. & Tsang, K. L. 2004 A Novel Active Grating Monochromator — Active Grating Spectrometer Beamline System for Inelastic Soft-X-ray Scattering Experiments. AIP Conf. Proc. 705, 655–658.Google Scholar

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