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X-ray diffraction from partially disordered layer structures: General case

  • B. K. Ray (a1), A. K. De (a1) and S. Bhattacherjee (a1)

Abstract

A general expression for diffracted intensities from partially ordered layer structures with a ‘mistake’ has been calculated. The ‘mistake’ consists of a shift of a layer parallel to adjacent layers by any arbitrary fraction b/q along the b axis, q being any integer. The expression is free from any simplifying approximations.

Résumé

On a calculé une relation donnant les intensités diffractées par des structures en feuillets partiellement ordonnés comportant une ‘faute’. La ‘faute’ est constituée par un déplacement d'un feuillet parallèle par rapport aux feuillets voisins, déplacement se faisant selon une fraction arbitraire quelconque b/q le long de l'axe b, qétant un entier. La relation ne comporte aucune approximation simplificatrice.

Kurzreferat

Es wurde ein allgemeiner Ausdruck berechnet für die Beugungsintensitäten von mit einem Fehler behafteten, teilweise geordneten Schichtstrukturen. Dieser Fehler besteht in einer a-Verschibung einer zu benachbarten Schichten parallelen Schicht für jede willkürliche Beugung b/q längs der b-Achse, wobei q irgendeine ganze Zahl ist. Dieser Ausdruck ist frei von vereinfachenden Annahmen.

Resumen

Se ha calculado una expresión general para intensidades difractadas de estructuras de capas parcialmente ordenadas con un ‘error’. El ‘error’ consiste en un desplazamiento de una capa paralela a capas adyacentes en cualquier fracción b/q arbitraria a lo largo del eje, siendo q un número entero. La expresión está libre de aproximaciones simplificatorias.

Copyright

References

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Brindley, G.W. (1961) X-ray diffraction by layer lattices with random layer displacements. Pp. 446-466 in: The X-ray IDentification and Crystal Structures of Clay Minerals (G. Brown, editor), Mineralogical Society, London.
Brindley, G.W. & MéRing, J (1951) Diffractions Des rayons X par les structures en couches Desordonnées. I. Acta Cryst. 4, 44147.
Plancon, A & Tchoubar, C (1977) Determination of structural Defects in phyllosilicates by X-ray powDer diffraction. I. Clays Clay Miner. 25, 430435.
Warren, B.E. (1941) Diffraction by random layers. Physical Rev. 59, 693698.
Wilson, A.J.C. (1949) X-ray diffraction by random layers: iDeal line profiles and Determination of structure amplituDes from observed line profiles. Acta Cryst. 2, 245251.
Wilson, A.J.C. (1962) X-ray Optics. Methuen, London.

X-ray diffraction from partially disordered layer structures: General case

  • B. K. Ray (a1), A. K. De (a1) and S. Bhattacherjee (a1)

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