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X-Ray Polarization: Bragg Diffraction and X-Ray Flurorescence

Published online by Cambridge University Press:  06 March 2019

John D. Zahrt
John D. Zahrt*
Affiliation:
Chemistry Department, Northern Arizona University, Flagstaff, Arizona 86011
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Extract

Recent, state of the art, x-ray spectrometers have made use of polarizing the source x-rays by scattering through 90° (1) . One then observes the analyte fluorescence in a direction perpendicular to the scattering plane in which the polarized x-rays are generated. The signal/noise ratio at the detector is much improved. Unfortunately there is a concomitant loss of intensity and analysis times increase. This adversely affects the minimum detection limits.

Type
VI. New XRF Instrumentation and Techniques
Information
Advances in X-Ray Analysis , Volume 26: Thirty-First Annual Conference on Applications of X-ray Analysis, August 1-6, 1982 , 1982 , pp. 331 - 336
Copyright
Copyright © International Centre for Diffraction Data 1982

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References

1. Ryon, Richard, Adv. in X-Ray Analysis, 20, 575–2 (1977),Google Scholar
2. Ryon, R. and Zahrt, J., Adv. in X-Ray Analysis, 22, 453–2 (1979).Google Scholar
3. Aiginger, H., Wobrauschek, P. and Brauner, C., Nuc. Instr. and Keth. U O, 541–2 (1974).Google Scholar
4. Wobrauschek, P. and Aiginger, H., submitted to X-Ray Spectrometry.Google Scholar
5. Ryon, R., Zahrt, J., Wobrauschek, P. and Aiginger, H., Adv. in X-Ray Analysis 20 (1982).Google Scholar
6. Zachariasen, William, “Theory of X-Ray Diffraction in Crystals,“ Dover Publishing Co., New York, 1967.Google Scholar