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X-Ray Microprobe Studies Using Multilayer Focussing Optics

  • A.C. Thompson (a1), J.H. Underwood (a1), Y. Wu (a1), R.D. Giauque (a1), M.L. Rivers (a2) and R. Futernick (a3)...

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The availability of intense x-rays from synchrotron radiation sources permits the elemental analysis of samples in new ways. An x-ray microprobs using these sources allows the analysis of much smaller samples with greatly improved elemental sensitivity. In addition to the higher x-ray intensity obtained at synchrotron sources, the development of high efficiency x-ray reflectors using multilayer coated optical mirrors permits the achievement of spot sizes of less than 10 μm x 10 μm with enough x-ray intensity to simultaneously measure femtogram quantities of many elements in less than one minute. Since samples to be studied in an x-ray microprobe do not have to be placed in a vacuum, almost any sample can be conveniently analyzed. With an x-ray microprobe it is possible to obtain elemental distributions of elements in one, two or even three dimensions.

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1. Sparks, C.J. Jr. , X-ray Fluorescence Microprobe for Chemical Analysis, in: “Synchrotron Radiation Research”, Winick, H. and Doniach, S., ed. , Plenum Press, New York(l980).
2. Thompson, A.C., Underwood, J.H., Wu, Y., Giauque, R.D., Jones, K.W. and Rivers, M.L., Elemental Measurements With an X-Ray Microprobe of Biological and Geological Samples With Femtogram Sensitivity, Nucl. Instr. and Meth. A226:318 (1987).
3. Underwood, J.H., Thompson, A.C., Wu, Y. and Giauque, R.D., X-Ray Microprobe Using Multilayer Mirrors, Nucl. Instr. and Meth. A226: 296 (1987) ,
4. Giauque, R.D., Thompson, A.C., Underwood, J.H., Wu, Y., Jones, K.W. and Rivers, M.L., Measurement of Femtogram Quantities of Trace Elements Using an X-Ray Microprobe. Anal. Chem. 60:885 (1988).
5. Cahill, T.A. et al. , The Vinland Map, Revisited: New Compositional Evidence on Its Inks and Parchment, Anal. Chem., 59: 829 (1987).
6. McCrone, W.C.. The Vinland Map. Anal. Chem. 60: 1009 (1988).

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