Skip to main content Accessibility help

X-Ray Fluorescence Analysis of Stainless Steels and Low Alloy Steels Using Secondary Targets and the Exacta) Program

  • J. C. Harmon (a1), G.E.A. Wyld (a1), T. C. Yao (a1) and J. W. Otvos (a1)


Exact is a mini-computer based fundamental parameters program which is utilized for matrix corrections in energy-dispersive X-ray analyses. We have previously shown this technique to work well with radioactive sources. However, due to the limited selection of isotopic sources available and their inherent low X-ray flux, we have investigated the use of Fe, Sn, and Dy secondary-targets as sources of monochromatic X-rays. Results to date indicate that the secondary-targets provide X-ray radiation which has sufficient monochromaticity for our technique to remain valid.



Hide All

Author to whom correspondence should be sent.


Present address: Kevex Corporation, Foster City, Ca.


Present address: University of California, Lawrence Berkeley Laboratory, Berkeley, California 94720


Energy-Dispersive X-Ray Analysis Computation Technique.



Hide All
1. Lachance, G. R. and. Traill, R. J., “A Practical Solution To The Matrix Problem in X-Ray Analysis”, Can. Spectry., 11, 43 (1966).
2. Claisse, F. and Quintin, M., “Generalization of The Lachance-Traill Method for The Correction of The Matrix Effect in X-Ray Fluorescence Analysis”, Can. Spectry., 12, 129 (1967).
3. Rasberry, S. D. and. Heinrich, K. F. J., “Calibration For Interelement Effects in X-Ray Fluorescence Analysis”, Anal. Chem., 46, 81 (1974).
4. Locas Tooth, H. J. and Pyne, C., “The Accurate Determination of Major Constituents by X-Ray Fluorescence Analysis in The Presence of Large Interelement Effects”, Advances In X-Ray Analysis, 7, 523(1964).
5. Gillman, E. and Heal, H. T., “Some Problems in The Analysis of Steels by X-Ray Fluorescence”, Brit. J. Appl. Phys., 3, 353 (1952).
6. Sherman, J., “The Theoretical Derivation of Fluorescent X-Ray Intensities from Mixtures”, Spectrochimics Acta, 7, 283 (1955).
7. Shlrawiwa, T. and Fujino, N., “Theoretical Calculations of Fluorescent X-Ray Intensities in Fluorescent X-Ray Spectrometric Analysis”, Jap. J. Appl. Phys., 5, 886 (1966).
8.. Criss, J. W. and Birks, L. S., “Calculation Methods for Fluorescent X-Ray Spectrometry”, Anal. Chem., 40, 1080 (1968).
9. Gardner, R. P., Wielopolski, L., and Doster, J. M. , “Adaptation of The Fundamental Parameters Monte Carlo Simulation to EDXRF Analysis With Secondary Fluorescer X-Ray Machines”, Advances in X-Ray Analysis, 21, 129(1977).
10. Otvos, J. W., Wyld, G., and Yao, T. C., “Fundamental Parameter Method for Quantitative Elemental Analysis with Monochromatic X-Ray Sources”, 25th Annual Denver X-Ray Conference, 1976.
11. Bracewell, B., and Veigele, W. J., “Devel, In Appl. Spec.”, 9, 357400 (1971).
12. Fink, R. W. and Ras, P. V., “Handbook of Spec.”, Vol. 1, pp. 219223, CRC Press, Cleveland, Ohio (1974).
13. Birks, L. S., “Handbook of Spec.” Vol. 1, pp. 230, CRC Press, Cleveland, Ohio (1974).


Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed