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X-Ray Diffraction Orientation Studies Using Two-Dimensional Detectors

Published online by Cambridge University Press:  06 March 2019

T.N. Blanton
T.N. Blanton*
Affiliation:
Analytical Technology Division Kodak Park B49 Eastman Kodak Company Rochester, NY 14652-3712
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Extract

Two-dimensional detectors utilized in x-ray diffraction studies are described. Film, image intensifier/CCD camera, two-dimensional position-sensitive area, and photostimulable storage phosphor detectors are compared. The storage phosphor detector was found to be well suited for analysis of oriented semicrystalline polyester films. Quantitation of polymer orientation was determined using the Hermans orientation distribution function.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 37: Forty-Second Annual Conference on Applications of X-ray Analysis, August 2-6, 1993 , 1993 , pp. 367 - 373
Copyright
Copyright © International Centre for Diffraction Data 1993

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References

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