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X-ray Diffraction Analysis of High Tc Superconducting Thin Films

  • T. C. Huang (a1), A. Segmuller (a1), W. Lee (a1), V. Lee (a1), D. Bullock (a1) and R. Karimi (a1)...

Abstract

X-ray diffraction techniques have been used for the structure characterization of Y-Ba-Cu-O and Tl-Ca-Ba-Cu-O thin films. A powder diffraction analysis of Y-Ba-Cu-O films showed that the films deposited at 650°C on Si are polycrystalline and have an orthorhambic structure similar to that of the YBa2Cu3O7 bulk superconductors. In addition to the conventional powder diffraction technique, both the rocking curve and the grazing incidence diffraction methods were used to characterize a YBa2Cu3O7 film on (110) SrTiO3 substrate. Results showed that the film was epitaxially grown and aligned with its substrate in a true epitaxy. Phase identification and line broadening analyses of Tl-Ca-Ba-Cu-O films showed that the films are comprised of one or more superconducting phases and probably contain stacking faults.

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X-ray Diffraction Analysis of High Tc Superconducting Thin Films

  • T. C. Huang (a1), A. Segmuller (a1), W. Lee (a1), V. Lee (a1), D. Bullock (a1) and R. Karimi (a1)...

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