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Use of X-Ray Spectrometer Data in Radial Distribution Analysis of the Diffraction Patterns for Amorphous Materials

  • H. E. Robson (a1) and L. Broussard (a1)

Abstract

Previous radial distribution work which we have found reported in the literature has invariably been based on film technique. Our work is entirely based on X-ray spectrometer intensity measurements, Radial distribution (RD) patterns for silica gel and η-aluinina are presented and the correlation with accepted structures for these materials demonstrated. The advantages of spectrometer over film technique are discussed. The entire calculation problem has been programed for the IBM 650 computer, A difference technique which appears very sensitive to small structure changes is described and demonstrated for silica-alumina cracking catalysts. A procedure for identifying systematic errors in the RD pattern is presented.

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1. Warren, B. E. and Gingrich, N. S., “Fourier Integral Analysis of X-Ray Powder Patterns,” Phys. Rev., Vol. 46, 1934, p. 368.
2. James, R. W., The Crystalline State, Vol. II—The Optical Principles of the Diffraction of X-Rays, G. Bell and Sons, London, 1948. p. 504.
3. Warren, B. E., Krutter, H., and Morningstar, O.. “Fourier Analysis of X-Ray Patterns of Vitreous SiO2 and B2O3,” J. Am. Ceram. Soc., Vol. 19, 1936, p. 202.
4. Klug, H. P. and Alexander, L. E., X-Ray Diffraction Procedures, John Wiley and Sons, New York, 1954, p. 596.

Use of X-Ray Spectrometer Data in Radial Distribution Analysis of the Diffraction Patterns for Amorphous Materials

  • H. E. Robson (a1) and L. Broussard (a1)

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