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Use of Scattered Secondary Target Radiation in EDXRF Analysis: A Fundamental-Parameter Method for Matrix Correction

  • Tom O'Reilly (a1) and Bi-Shia W. King (a2)

Abstract

A new fundamental-parameter program has been developed which corrects for light element absorption based on the mean atomic number of the sample. The mean atomic number, in turn, is determined from the Compton/Rayleigh scatter intensity ratio. The program is quite flexible with regard to the number and the type of standards which may be used. The accuracy and precision of the method has been evaluated with several geological and biological standards. The results are in good agreement with those obtained by some other methods (CEMAS, XRF-11).

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Use of Scattered Secondary Target Radiation in EDXRF Analysis: A Fundamental-Parameter Method for Matrix Correction

  • Tom O'Reilly (a1) and Bi-Shia W. King (a2)

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