No CrossRef data available.
Article contents
Use of a High-Temperature X-Ray Diffractometer to Measure the Temperature Dependence of Reflection Intensities*
Published online by Cambridge University Press: 06 March 2019
Abstract
The temperature dependence of the reflection intensities from copper was examined in order to determine the mean-square vibration amplitudes of the atoms in the metal. The reflections from a prealigned single crystal were examined in a Norelco diffractometer outfitted with a high-temperature chamber designed by Chiotti. The intensities of the (400) reflection for copper were measured at temperatures from 13 to 1000°C. Difficulty was experienced in obtaining reproducible intensity measurements, and it is suggested that this was due to changes in the mosaic structure of the single crystal during thermal cycling.
- Type
- Research Article
- Information
- Copyright
- Copyright © International Centre for Diffraction Data 1961
Footnotes
*
Work done in the Ames Laboratory of the Atomic Energy Commission.
References
1.
Chiotti, P., “Adaptation of a Geiger Counter X-ray Diffractonieter for High-Temperature Investigation,” Rev. of Sci, Instr., Vol. 25, 1954, p. 683.Google Scholar
2.
Boskovits, J., Roilos, M., Theodossiou, A., and Alexopoulos, K., “The Characteristic Temperature of Silver from X-ray Reflections,” Acta Cryst., Vol. 11, 1958, p. 845.Google Scholar
3.
Spreadborough, J. and Christian, J. W., “The Measurement of the Lattice Expansions and Debye Temperatures of Titanium and Silver by X-ray Methods,” Proc. Phys. Soc., (London), Vol. 74, 1959, p. 609.Google Scholar
4.
Paskin, A., “A Reformulation of the Temperature Dependence of the Debye Characteristic Temperature and its Effect on Debye-Waller Theory,” Acta Cryst., Vol. 10, 1957, p. 667.Google Scholar
5.
James, R. W., The Optical Principles of the Diffraction of X-rays, London, G. Bell and Sons, Ltd., 1958, p. 286.Google Scholar