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TXRF with Various Excitation Sources

Published online by Cambridge University Press:  06 March 2019

Peter Wobrauschek
Affiliation:
Atominstitut der Österreichischen Universitäten Schüttelstraße 115, A 1020 Wien, Austria
Peter Kregsamer
Affiliation:
Atominstitut der Österreichischen Universitäten Schüttelstraße 115, A 1020 Wien, Austria
Christina Streli
Affiliation:
Atominstitut der Österreichischen Universitäten Schüttelstraße 115, A 1020 Wien, Austria
Robert Rieder
Affiliation:
Atominstitut der Österreichischen Universitäten Schüttelstraße 115, A 1020 Wien, Austria
Hannes Aiginger
Affiliation:
Atominstitut der Österreichischen Universitäten Schüttelstraße 115, A 1020 Wien, Austria
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Abstract

Improving the detection limits in TXRF by optimizing the excitation conditions is the goal of this work. The properties of the exciting radiation due to spectral distribution, polarisation, intensity and energy are investigated and compared to find best conditions. Results are given from experiments performed with synchrotron radiation, Bragg polarized monoenergetic x-rays, high energy cut-off reflector in the primary beam path of a high power x-ray tube and several geometries for the sample reflector.

Type
XII. Total Reflection XRS
Copyright
Copyright © International Centre for Diffraction Data 1991

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References

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