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Total-Reflection X-ray Fluorescence of Thin Layers on and in Solids

  • D. K. G. De Boer (a1) and W. W. van den Hoogenhof (a2)


The angular dependence of Total-reflection X-Ray Fluorescence intensities can behave in various ways. The variety is discussed by examining the x-ray intensity distribution in the material under investigation. It is shown that for thin layers on solids, interference fringes are present due to x-ray standing waves. This phenomenon is exploited to determine the depth distribution of elements in layered specimens.



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Total-Reflection X-ray Fluorescence of Thin Layers on and in Solids

  • D. K. G. De Boer (a1) and W. W. van den Hoogenhof (a2)


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