Skip to main content Accessibility help
×
Home

Total-Reflection X-ray Fluorescence of Thin Layers on and in Solids

  • D. K. G. De Boer (a1) and W. W. van den Hoogenhof (a2)

Abstract

The angular dependence of Total-reflection X-Ray Fluorescence intensities can behave in various ways. The variety is discussed by examining the x-ray intensity distribution in the material under investigation. It is shown that for thin layers on solids, interference fringes are present due to x-ray standing waves. This phenomenon is exploited to determine the depth distribution of elements in layered specimens.

Copyright

References

Hide All
1. Parratt, L. G., Phys. Rev. 95 (1954) 359.10.1103/PhysRev.95.359
2. Prange, A., Spectrochim. Acta 44B (1989) 437; P. Wobrausehek, paper presented at this conference.10.1016/0584-8547(89)80049-7
3. Brunel, M., Acta Cryst. A42 (1986) 304; M. Brunei and B. Gilles, Coll. Phys. C7 (1989) 85.
4. de Boer, D. K. G. and van den Hoogenhof, W. W., Spectrochim, Acta B, submitted; D. K.G. de Boer, to be published.
5. Bernike, W., paper presented at 3d TXRF Workshop, Vienna 1990; H. Schwenke, paper presented at European EDXRF Workshop, Antwerp 1990.
6. Król, A., Sher, C. J. and Kao, Y. H., Phys. Rev. B 38 (1988) 8579.10.1103/PhysRevB.38.8579
7. Barbee, T. W. Jr. and Waxburton, W. K., Mater. Lett. 3 (1984) 17.
8. Bartels, W. J., J. Vac. Sci. Technol. 81 (1983) 338.10.1116/1.582553
9. Batterman, B. W. and Cole, H., Rev. Mod. Phys. 36 (1964) 681.
10. Patel, J. R., Zegenhagen, J., Freeland, P. E., Hybertsen, M. S., Golovchenko, J. A. and Chen, D. M., J.Vac. Sci. Technol. B7 (1989) 894 and refs, herein.
11. Bedzyk, M. J., Bilderback, D. H., Bommarito, G. M., Caffrey, M. and Schildkraul, J. S., Science 241 (1988) 1788.10.1126/science.3175619
12. Bedzvk, M. J., Bommarito, G. M. and Schildkraut, J. S., Phys. Rev. Lett. 62 (1989) 1376.10.1103/PhysRevLett.62.1376
13. Becker, R. S., Golovchenko, J. A. and Patel, J. R., Phys. Rev. Lett. 50 (1983) 153.

Total-Reflection X-ray Fluorescence of Thin Layers on and in Solids

  • D. K. G. De Boer (a1) and W. W. van den Hoogenhof (a2)

Metrics

Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed