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Total-Reflection X-ray Fluorescence of Thin Layers on and in Solids
Published online by Cambridge University Press: 06 March 2019
Abstract
The angular dependence of Total-reflection X-Ray Fluorescence intensities can behave in various ways. The variety is discussed by examining the x-ray intensity distribution in the material under investigation. It is shown that for thin layers on solids, interference fringes are present due to x-ray standing waves. This phenomenon is exploited to determine the depth distribution of elements in layered specimens.
- Type
- I. Surface and Near-Surface X-Ray Spectroscopy
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- Copyright © International Centre for Diffraction Data 1990
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