Skip to main content Accessibility help

Total Reflectance X-Ray Spectrometry

  • Hannes Aiginger (a1) and Peter Wobrauschek (a1)


The reduction of the background in x-ray fluorescent spectra is achieved by total reflection of the primary x-rays at a plane, smooth surface of a suitable reflector material. This effect essentially reduces the background caused by scattering of the primary photons from the substrate, thus improving the lower limits of detection in x-ray fluorescence analysis (XRF). Introducing additional to the reflector-substrate another reflector in the primary beam, this affects the spectral distribution of the exciting radiation (“high energy cutoff”). The result is an improved background, where detection limits of picogram amounts or concentrations in the ppb range are attainable for medium Z elements with energy dispersive detectors.



Hide All
1. Yoneda, Y. and Horiuchi, T., Optical Flats for Use in X-Ray Spectro-chemical Microanalysis, Rev.Sci.Instr. 42, 10691070 (1971)
2. Aiginger, H. and Wobrauschek, P., A Method for Quantitative X-Ray Fluorescence Analysis in the Nanogram Region, Nucl.Instr. Meth. 114 157158 (1974)
3. Wobrauschek, P. and Aiginger, H., Total Reflection X-Ray Fluorescence Spectrometric Determination of Elements in Nanogram Amounts Anal .Chem. 47, 852855 (1975)
4. Knoth, J. and Schwenke, H., An X-Ray Fluorescence Spectrometer with Totally Reflecting Sample Support for Trace Analysis at the ppb Level, Fresenius Z.Anal,Chem. 291, 200204 (1978)
5. Knoth, J. and Schwenke, H., Fresenius Z.Anal.Chem. 301, 7 (1980)
6. Schwenke, H. and Knoth, J., A Highly Sensitive Energy-Dispersive- X-Ray Spectrometer with Multiple Total Reflection of the Exciting Beam, Nucl.Instr. Meth. 193, 239243 (1982)
7. Freitag, K., Energy Dispersive X-Ray Fluorescence Analysis with Multiple Total Reflection-An Improvement of Detection Limits, Report Richard Seifert & Co, Bogenstrasse 41, D 2070 Ahrensburg
8. Ketelsen, P. und Knöchel, A., Multielement Analysis of Aerosol Samples by X-Ray Fluorescence Analysis with Totally Reflecting Sample Holders (in German), Fresenius Z.Anal.Chem. 317, 333342 (1984)
9. Lurf, G., Energiedispersive Total reflexions-Röntgenfluoreszenzanalyse für Elemente niedriger Ordnungszabl, Dissertation TU Wien (1984)
10. Prange, A., Development of a Trace Analytical Procedure for the Determination of Dissolved Heavy Metals in Sea Water Using Total Reflection X-Ray Fluorescence Analysis (in German), Thesis University of Hamburg (1983)


Full text views

Total number of HTML views: 0
Total number of PDF views: 0 *
Loading metrics...

Abstract views

Total abstract views: 0 *
Loading metrics...

* Views captured on Cambridge Core between <date>. This data will be updated every 24 hours.

Usage data cannot currently be displayed