Hostname: page-component-8448b6f56d-sxzjt Total loading time: 0 Render date: 2024-04-18T09:43:31.983Z Has data issue: false hasContentIssue false
  • English
  • Français

Toroidally Shaped Hopg Crystals as Strongly Focusing Bragg Reflectors of Characteristic X-Ray Tube Radiation for Edxrf Analysis

Published online by Cambridge University Press:  06 March 2019

B. Beckhoff ,
B. Kanngieβer ,
J. Scheer ,
W. Swoboda  and
J. Laursen
B. Beckhoff
Affiliation:
University of Bremen, Department of Physics, P.O. 330 440 D-28334 Bremen, Germany
B. Kanngieβer
Affiliation:
University of Bremen, Department of Physics, P.O. 330 440 D-28334 Bremen, Germany
J. Scheer
Affiliation:
University of Bremen, Department of Physics, P.O. 330 440 D-28334 Bremen, Germany
W. Swoboda
Affiliation:
University of Bremen, Department of Physics, P.O. 330 440 D-28334 Bremen, Germany
J. Laursen
Affiliation:
Royal Veterinary and Agricultural University Department of Mathematics and Physics DK-1871 Frederiksberg C, Denmark
Get access

Abstract

The characteristic 17.441 keV Mo-Kα tube line yields an exceedingly strong reflection at a Bragg angle of 6.0710 on Highly Oriented Pyrolytic Graphite (IIOPG). Using doubly bent toroidally shaped crystals we were able to concentrate the characteristic radiation from a Mo anode fine focus tube onto a small focal spot area of about 1 mm. FWHM diameter, as was observed by an X-Ray sensitive CCD. The radiation of the Mo anode fine focus tube is emitted at a take-off angle of 60 into a total solid angle with an aperture of 120. About 90 percent of this primary radiation solid angle can be used for the desired Bragg reflection on the designed toroidal crystal surface. This feature ensures the high beam intensity needed for special excitation problems.

Type
Research Article
Information
Advances in X-Ray Analysis , Volume 37: Forty-Second Annual Conference on Applications of X-ray Analysis, August 2-6, 1993 , 1993 , pp. 523 - 533
Copyright
Copyright © International Centre for Diffraction Data 1993

Access options

Get access to the full version of this content by using one of the access options below. (Log in options will check for institutional or personal access. Content may require purchase if you do not have access.)

References

1. Kanngieβer, B., Beckhoff, B., Scheer, J., Swoboda, W., X-Ray Spectrometry, 20, 331–136, (1991)Google Scholar
2. Laursen, J., Colloquium Spectroscopicum Internationale XXIV, Garmisch Partenkirchen (1985)Google Scholar
3. Beckhoff, B., Kanngieβer, B., Swoboda, W., Scheer, J., Advances in X-Ray Analysis, 35, 1083–1089, (1992)Google Scholar
4. Ryon, R. W.. Advances in X-Ray Analysis, 20, 575, (1977)Google Scholar
5. Furnas, T.C., Jr., Kuntz, G.S., Furnas, R.E., Advances in X-Ray Analysis, 25: 59–62, (1981)Google Scholar
6. Antonov, A.A., Grigoryeva, I. G. et al., Rev.Sci.Instrum., 60, 2462–2463, (1989)Google Scholar
7. Underwood, J. H., et al., Nucl. Instr. and Meth. in Physics Research, A266, 298–302, (1988)Google Scholar
8. Azároff, L.V., ‘Elements of X-Ray Crystallography’, McGraw-Hill, New York, 116–118(1968)Google Scholar
9. B., Beckhoff, et al., ‘Monte Carlo based Ray Tracing for X-Ray Focusing Devices', to be publishedGoogle Scholar
10. B., Beckhoff, J., Laursen, ‘Bent and Flat Highly Oriented Pyrolytic Graphite Crystals as Small Bragg Angle Monochromators in the Thin Specimen EDXRF Analysis', European EDXRF Workshop, Mykonos (1992), accepted for publication in X-Ray Spectrometry (1993)Google Scholar
11. Zachariasen, W.H., ‘Theory of X-Ray Diffraction in Crystals’, Dover Publications, New York (1967)Google Scholar
12. Lawrencc, J.L., Acta Cryst., A38. 859–863 (1982)Google Scholar